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Abnormal Recovery Phenomenon Induced by Hole Injection During Hot Carrier Degradation in SOI n-MOSFETs 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Lu, Ying-Hsin; Chang, Ting-Chang; Chen, Li-Hui; Lin, Yu-Shan; Liu, Xi-Wen; Liao, Jih-Chien; Lin, Chien-Yu; Lien, Chen-Hsin; Chang, Kuan-Chang; Zhang, Sheng-Dong
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Experimental Investigation of Ballistic Carrier Transport for Sub-100-nm Ge n-MOSFETs 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Cheng, Ran; Yin, Longxiang; Wu, Heng; Yu, Xiao; Zhang, Yanyan; Zheng, Zejie; Wu, Wangran; Chen, Bing; Ye, Peide D.; Liu, Xiaoyan; Zhao, Yi
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
High sensitivity and large measurement range refractometric sensing based on Mach-Zehnder interferometer 其他
2016-01-01
Zhang, G.; Cai, H.; Gu, Y.D.; Song, J.F.; Dong, B.; Yang, Z.C.; Jin, Y.F.; Hao, Y.L.; Sivalingam, S.P.; Yap, P.H.; Kwong, D.L.; Liu, A.Q.
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03
A High-Voltage (> 600 V) N-Island LDMOS With Step-Doped Drift Region in Partial SOI Technology 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
Hu, Yue; Wang, Hao; Du, Caixia; Ma, Miaomiao; Chan, Mansun; He, Jin; Wang, Gaofeng
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Athermal and flat-topped silicon Mach-Zehnder filters 期刊论文
OPTICS EXPRESS, 2016
Deng, Qingzhong; Liu, Lu; Zhang, Rui; Li, Xinbai; Michel, Jurgen; Zhou, Zhiping
收藏  |  浏览/下载：9/0  |  提交时间：2017/12/03
HIGH SENSITIVITY AND LARGE MEASUREMENT RANGE REFRACTOMETRIC SENSING BASED ON MACH-ZEHNDER INTERFEROMETER 其他
2016-01-01
Zhang, G.; Cai, H.; Gu, Y. D.; Song, J. F.; Dong, B.; Yang, Z. C.; Jin, Y. F.; Hao, Y. L.; Sivalingam, S. P.; Yap, P. H.; Kwong, D. L.; Liu, A. Q.
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
A reflective mirror microcantilevers-based biosensor for biochemical detection 期刊论文
OPTIK, 2016
Wen, Feng; Zhao, Yuejin; Yu, Xiaomei; Ren, Yongfeng
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Investigation of local heating effect for 14nm Ge pFinFETs based on Monte Carlo method 其他
2016-01-01
Yin, Longxiang; Jiang, Hai; Shen, Lei; Wang, Juncheng; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Characterization of Self-heating Leads to Universal Scaling of HCI Degradation of Multi-Fin SOI FinFETs 其他
2016-01-01
Jiang, Hai; Shin, SangHoon; Liu, Xiaoyan; Zhang, Xing; Alam, Muhammad Ashraful
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Analysis of Self-heating Effect in a SOI LDMOS Device under an ESD Stress 其他
2016-01-01
Tianxing Li; Jian Cao; Lizhong Zhang; Yuan Wang
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03

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