×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
半导体研究所 [25]
内容类型
期刊论文 [22]
会议论文 [3]
发表日期
2011 [4]
2010 [1]
2009 [4]
2008 [2]
2007 [1]
2006 [4]
更多...
学科主题
半导体材料 [25]
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共25条,第1-10条
帮助
限定条件
学科主题:半导体材料
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
发表日期升序
发表日期降序
提交时间升序
提交时间降序
题名升序
题名降序
作者升序
作者降序
Investigation of cracks in GaN films grown by combined hydride and metal organic vapor-phase epitaxial method
期刊论文
nanoscale research letters, 2011, 卷号: 6, 页码: article no.69
作者:
Song HP
;
Wei HY
;
Li CM
;
Jiao CM
收藏
  |  
浏览/下载:65/4
  |  
提交时间:2011/07/05
CATHODOLUMINESCENCE CHARACTERIZATION
GALLIUM NITRIDE
STRESSES
LAYERS
HETEROSTRUCTURE
DEPOSITION
CONSTANTS
MECHANISM
SAPPHIRE
STRAIN
Effect of high temperature AlGaN buffer thickness on GaN Epilayer grown on Si(111) substrates
期刊论文
journal of materials science-materials in electronics, 2011, 卷号: 22, 期号: 8, 页码: 1028-1032
作者:
Pan X
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2011/09/14
CHEMICAL-VAPOR-DEPOSITION
PHASE EPITAXY
ALN INTERLAYERS
FILMS
STRESS
LAYERS
DISLOCATIONS
REDUCTION
DENSITY
DIODES
Effect of AlN buffer thickness on GaN epilayer grown on Si(1 1 1)
期刊论文
materials science in semiconductor processing, 2011, 卷号: 14, 期号: 2, 页码: 97-100
Wei, M
;
Wang, XL
;
Pan, X
;
Xiao, HL
;
Wang, CM
;
Hou, QF
;
Wang, ZG
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2012/01/06
GaN
MOCVD
Si(111)
AlN
VAPOR-PHASE EPITAXY
LAYERS
SUBSTRATE
MOCVD
STRESS
Growth of GaN film on Si (111) substrate using AlN sandwich structure as buffer
期刊论文
journal of crystal growth, 2011, 卷号: 318, 期号: 1, 页码: 464-467
作者:
Pan X
收藏
  |  
浏览/下载:81/5
  |  
提交时间:2011/07/05
Sandwich structure
Stress
Aluminum nitride
Gallium nitride
Silicon
PHONON DEFORMATION POTENTIALS
WURTZITE ALN
SILICON
STRESS
TRANSISTORS
EPITAXY
LAYERS
Stretchable Graphene: A Close Look at Fundamental Parameters through Biaxial Straining
期刊论文
nano letters, 2010, 卷号: 10, 期号: 9, 页码: 3453-3458
Ding F (Ding Fei)
;
Ji HX (Ji Hengxing)
;
Chen YH (Chen Yonghai)
;
Herklotz A (Herklotz Andreas)
;
Dorr K (Doerr Kathrin)
;
Mei YF (Mei Yongfeng)
;
Rastelli A (Rastelli Armando)
;
Schmidt OG (Schmidt Oliver G.)
收藏
  |  
浏览/下载:243/38
  |  
提交时间:2010/09/20
Graphene
strain engineering
Gruneisen parameters
Raman spectroscopy
piezoelectric actuator
Well-width dependence of in-plane optical anisotropy in (001) GaAs/AlGaAs quantum wells induced by in-plane uniaxial strain and interface asymmetry
期刊论文
journal of applied physics, 2009, 卷号: 105, 期号: 10, 页码: art. no. 103108
作者:
Xu B
;
Ye XL
收藏
  |  
浏览/下载:68/0
  |  
提交时间:2010/03/08
aluminium compounds
gallium arsenide
III-V semiconductors
internal stresses
reflectivity
semiconductor heterojunctions
semiconductor quantum wells
Chemical etching of a GaSb crystal incorporated with Mn grown by the Bridgman method under microgravity conditions
期刊论文
半导体学报, 2009, 卷号: 30, 期号: 8, 页码: 47-51
Chen Xiaofeng
;
Chen Nuofu
;
Wu Jinliang
;
Zhang Xiulan
;
Chai Chunlin
;
Yu Yude
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2010/11/23
Comparison and combination of several stress relief methods for cubic boron nitride films deposited by ion beam assisted deposition
期刊论文
surface & coatings technology, 2009, 卷号: 203, 期号: 10-11, 页码: 1452-1456
作者:
Tan HR
;
Zhang XW
;
You JB
;
Fan YM
收藏
  |  
浏览/下载:262/33
  |  
提交时间:2010/03/08
Cubic boron nitride
Stress relaxation
Ion beam assisted deposition
Fourier transformed infrared spectroscopy
Bulge testing and fracture properties of plasma-enhanced chemical vapor deposited silicon nitride thin films
期刊论文
thin solid films, 2009, 卷号: 517, 期号: 6, 页码: 1989-1994
作者:
Li Y
收藏
  |  
浏览/下载:359/38
  |  
提交时间:2010/03/08
Bulge test
Fracture property
Silicon nitride
Weibull distribution function
Effect of indium-doped interlayer on the strain relief in GaN films grown on Si(111)
期刊论文
physica status solidi a-applications and materials science, 2008, 卷号: 205, 期号: 2, 页码: 294-299
Wu, JJ
;
Zhao, LB
;
Zhang, GY
;
Liu, XL
;
Zhu, QS
;
Wang, ZG
;
Jia, QJ
;
Guo, LP
;
Hu, TD
收藏
  |  
浏览/下载:65/3
  |  
提交时间:2010/03/08
CHEMICAL-VAPOR-DEPOSITION
TEMPERATURE ALN INTERLAYERS
PHASE EPITAXY
OPTICAL-PROPERTIES
SURFACTANT
SUBSTRATE
STRESS
SI
REDUCTION
SAPPHIRE
©版权所有 ©2017 CSpace - Powered by
CSpace