CORC

浏览/检索结果: 共234条,第1-10条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
质子辐照对RADFETs的γ辐照剂量响应的影响研究 期刊论文
核技术, 2022, 卷号: 45, 期号: 1, 页码: 39-45
作者:  马函1,2;  孙静1;  何承发1;  荀明珠1
收藏  |  浏览/下载:30/0  |  提交时间:2022/01/25
Synergistic effects of total ionizing dose and radiated electromagnetic interference on analog-to-digital converter 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2022, 卷号: 33, 期号: 3, 页码: 1-9
作者:  Wu, P (Wu, Ping) [1] , [2];  Wen, L (Wen, Lin) [3] , [4];  Xu, ZQ (Xu, Zhi-Qian) [1] , [2];  Jiang, YS (Jiang, Yun-Sheng) [1] , [2];  Guo, Q (Guo, Qi) [3] , [4]
收藏  |  浏览/下载:20/0  |  提交时间:2022/04/07
1/f Noise responses of Ultra-Thin Body and Buried oxide FD-SOI PMOSFETs under total ionizing dose irradiation 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2022, 卷号: 176, 期号: 11-12, 页码: 1202-1214
作者:  Zhang, RQ (Zhang, Ruiqin) [1] , [2] , [3];  Zheng, QW (Zheng, Qiwen) [1] , [2];  Lu, W (Lu, Wu) [1] , [2];  Cui, JW (Cui, Jiangwei) [1] , [2];  Li, YD (Li, Yudong) [1] , [2]
收藏  |  浏览/下载:20/0  |  提交时间:2022/04/07
Anti-irradiation SAW temperature sensor based on 128 degrees YX LiNbO3 single crystal 期刊论文
SENSORS AND ACTUATORS A-PHYSICAL, 2022, 卷号: 333, 期号: 1, 页码: 1-8
作者:  Zhao, CQ (Zhao, Caiqin) [1];  Geng, WP (Geng, Wenping) [1];  Qiao, XJ (Qiao, Xiaojun) [1];  Xue, F (Xue, Feng) [1];  He, JL (He, Jinlong) [1]
收藏  |  浏览/下载:21/0  |  提交时间:2022/05/17
Bias dependence of total ionizing dose effects in 22 nm bulk nFinFETs 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2022, 卷号: 177, 期号: 3-4, 页码: 372-382
作者:  Cui, X (Cui, Xu) [1] , [2] , [3];  Cui, JW (Cui, Jiang-Wei) [1] , [2] , [3];  Zheng, QW (Zheng, Qi-Wen) [1] , [2] , [3];  Wei, Y (Wei, Ying) [1] , [2] , [3];  Li, YD (Li, Yu-Dong) [1] , [2] , [3]
收藏  |  浏览/下载:17/0  |  提交时间:2022/06/21
Impact of High TID Irradiation on Stability of 65 nm SRAM Cells 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2022, 卷号: 69, 期号: 5, 页码: 1044-1050
作者:  Cui, JW (Cui, Jiangwei) [1];  Zheng, QW (Zheng, Qiwen) [1];  Li, YD (Li, Yudong) [1];  Guo, Q (Guo, Qi) [1]
收藏  |  浏览/下载:17/0  |  提交时间:2022/06/21
Total Ionizing Dose Effects of the Color Complementary Metal Oxide Semiconductor (CMOS) Image Sensor at Different Bias 期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2022, 卷号: 17, 期号: 1, 页码: 121-127
作者:  Yang, ZK (Yang, Zhikang) [1] , [2];  Wen, L (Wen, Lin) [1];  Li, YD (Li, Yudong) [1];  Liu, BK (Liu, Bingkai) [1] , [2];  Fu, J (Fu, Jing) [1] , [2]
收藏  |  浏览/下载:21/0  |  提交时间:2022/06/21
Experimental investigation on total-ionizing-dose radiation effects on the electrical properties of SOI-LIGBT 期刊论文
SOLID-STATE ELECTRONICS, 2021, 卷号: 175, 期号: 1, 页码: 1-7
作者:  Yang, GG (Yang, Guangan)[ 1 ];  Wu, WR (Wu, Wangran)[ 1 ];  Zhang, XY (Zhang, Xingyao)[ 2 ];  Tang, PY (Tang, Pengyu)[ 1 ];  Yang, J (Yang, Jing)[ 1 ]
收藏  |  浏览/下载:29/0  |  提交时间:2021/03/15
Mechanism of Ionization Damage in Large Eight-Transistor Complementary Metal-Oxide-Semiconductor Color Image Sensors 期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2021, 卷号: 16, 期号: 11, 页码: 1755-1761
作者:  Feng, J (Feng, Jie) [1] , [2];  Fu, J (Fu, Jing) [1] , [2] , [3];  Li, YD (Li, Yu-Dong) [1] , [2];  Wen, L (Wen, Lin) [1] , [2];  Guo, Q (Guo, Qi) [1] , [2]
收藏  |  浏览/下载:22/0  |  提交时间:2022/03/24
Impact of TID on Within-Wafer Variability of Radiation-Hardened SOI Wafers 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 7, 页码: 1423-1429
作者:  Zheng, QW (Zheng, Qiwen) 1;  Cui, JW (Cui, Jiangwei) 1;  Yu, XF (Yu, Xuefeng) 1;  Li, YD (Li, Yudong) 1;  Lu, W (Lu, Wu) 1
收藏  |  浏览/下载:40/0  |  提交时间:2021/08/06


©版权所有 ©2017 CSpace - Powered by CSpace