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CORC

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Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu
收藏  |  浏览/下载：68/0  |  提交时间：2022/01/12
Design and verification of multiple SEU mitigated circuits on SRAM-based FPGA system 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 7
作者:  Yu, Jian;  Cai, Chang;  Ning, Bingxu;  Gao, Shuai;  Liu, Tianqi
收藏  |  浏览/下载：28/0  |  提交时间：2022/01/24
SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA 期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 12, 页码: 12
作者:  Cai, Chang;  Gao, Shuai;  Zhao, Peixiong;  Yu, Jian;  Zhao, Kai
收藏  |  浏览/下载：39/0  |  提交时间：2022/01/19
Total Ionizing Dose Influence on the Single-Event Multiple-Cell Upsets in 65-nm 6-T SRAM 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 6, 页码: 892-898
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载：77/0  |  提交时间：2019/11/10
Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs 期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 3, 页码: 13
作者:  Ke, Lingyun;  Zhao, Peixiong;  Liu, Jie;  Fan, Xue;  Cai, Chang
收藏  |  浏览/下载：108/0  |  提交时间：2019/11/10
Low energy proton induced single event upset in 65 nm DDR and QDR commercial SRAMs 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 443-448
作者:  Ye, B.;  Liu, J.;  Wang, T. S.;  Liu, T. Q.;  Maaz, K.
收藏  |  浏览/下载：13/0  |  提交时间：2018/05/31
Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 页码: 6
作者:  Ye, Bing;  Liu, Jie;  Wang, Tie-Shan;  Liu, Tian-Qi;  Luo, Jie
收藏  |  浏览/下载：19/0  |  提交时间：2018/05/31
Simulation of the characteristics of low-energy proton induced single event upset 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2014, 卷号: 57, 页码: 1902-1906
作者:  Geng Chao;  Xi Kai;  Liu TianQi;  Liu Jie
收藏  |  浏览/下载：15/0  |  提交时间：2018/07/05
Modeling and assessing the influence of linear energy transfer on multiple bit upset susceptibility 期刊论文
CHINESE PHYSICS B, 2013, 卷号: 22
作者:  Gu Song;  Xi Kai;  Liu Jie;  Geng Chao;  Liu Tian-Qi
收藏  |  浏览/下载：14/0  |  提交时间：2018/07/05

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