Simulation of the characteristics of low-energy proton induced single event upset

doi:10.1007/s11433-014-5414-4

	Simulation of the characteristics of low-energy proton induced single event upset
	Geng Chao 1,2; Xi Kai 1,2; Liu TianQi 1,2; Liu Jie1
刊名	SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY
	2014-10-01
卷号	57 页码:1902-1906
关键词	Single Event Upset Proton Direct Ionization Monte Carlo
ISSN号	1674-7348
DOI	10.1007/s11433-014-5414-4
文献子类	Article
英文摘要	Monte Carlo simulation results are reported on the single event upset (SEU) triggered by the direct ionization effect of low-energy proton. The SEU cross-sections on the 45 nm static random access memory (SRAM) were compared with previous research work, which not only validated the simulation approach used herein, but also exposed the existence of saturated cross-section and the multiple bit upsets (MBUs) when the incident energy was less than 1 MeV. Additionally, it was observed that the saturated cross-section and MBUs are involved with energy loss and critical charge. The amount of deposited charge and the distribution with respect to the critical charge as the supplemental evidence are discussed.
资助项目	National Natural Science Foundation of China[11179003] ; National Natural Science Foundation of China[0975164] ; National Natural Science Foundation of China[10805062] ; National Natural Science Foundation of China[11005134]
WOS关键词	SILICON ; IONIZATION ; DEPOSITION ; GEANT4 ; MODELS ; SRAM
WOS研究方向	Physics
语种	英语
出版者	SCIENCE PRESS
WOS记录号	WOS:000340498300015
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/49913]
专题	中国科学院近代物理研究所
通讯作者	Liu Jie
作者单位	1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Geng Chao,Xi Kai,Liu TianQi,et al. Simulation of the characteristics of low-energy proton induced single event upset[J]. SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,2014,57:1902-1906.
APA	Geng Chao,Xi Kai,Liu TianQi,&Liu Jie.(2014).Simulation of the characteristics of low-energy proton induced single event upset.SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,57,1902-1906.
MLA	Geng Chao,et al."Simulation of the characteristics of low-energy proton induced single event upset".SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY 57(2014):1902-1906.