CORC

浏览/检索结果: 共3条,第1-3条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
Reduction of NiGe/n-and p-Ge Specific Contact Resistivity by Enhanced Dopant Segregation in the Presence of Carbon During Nickel Germanidation 期刊论文
IEEE Transactions on Electron Devices, 2016
作者:  Duan NY(段宁远);  Wang GL(王桂磊);  Liu JB(刘金彪);  Eddy simoen;  Mao SJ(毛淑娟)
收藏  |  浏览/下载:15/0  |  提交时间:2017/05/09
Study of SiGe selective epitaxial process integration with high-k and metal gate for 16/14 nm nodes FinFET technology 期刊论文
Microelectronics Engineering, 2016
作者:  Wang GL(王桂磊);  Qin ZL(秦长亮);  Yin HX(殷华湘);  Duan NY(段宁远);  Yang T(杨涛)
收藏  |  浏览/下载:9/0  |  提交时间:2017/05/09
On the Manipulation of Phosphorus Diffusion as Well as the Reduction of Specific Contact Resistivity in Ge by Carbon Co-Doping 期刊论文
ECS Transactions, 2016
作者:  Luo J(罗军);  Liu JB(刘金彪);  Eddy Simoen;  Wang GL(王桂磊);  Mao SJ(毛淑娟)
收藏  |  浏览/下载:27/0  |  提交时间:2017/05/09


©版权所有 ©2017 CSpace - Powered by CSpace