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北京航空航天大学 [11]
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Beyond Orowan hardening: Mapping the four distinct mechanisms associated with dislocation-precipitate interaction
期刊论文
INTERNATIONAL JOURNAL OF PLASTICITY, 2023, 卷号: 169, 页码: 103710
作者:
Peng, Shenyou
;
Wang, Zhili
;
Li, Jia
;
Fang, Qihong
;
Wei YJ(魏宇杰)
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2023/09/26
Dislocation
Precipitate
Orowan hardening
Radiation-emission
Interface-nucleation
Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies
期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:
He, Ze
;
Zhao, Shi-Wei
;
Liu, Tian-Qi
;
Cai, Chang
;
Yan, Xiao-Yu
收藏
  |  
浏览/下载:68/0
  |  
提交时间:2022/01/12
Double interlocked storage cell (DICE)
Error detection and correction (EDAC) code
Heavy ion
Radiation hardening technology
Single event upset (SEU)
Static random-access memory (SRAM)
Multiple Layout-Hardening Comparison of SEU-Mitigated Filp-Flops in 22-nm UTBB FD-SOI Technology
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 1, 页码: 374-381
作者:
Cai, Chang
;
Liu, Tianqi
;
Zhao, Peixiong
;
Fan, Xue
;
Huang, Hongyang
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2022/01/19
D filp-flops (DFFs)
heavy ions
radiation hardening
single-event upsets (SEUs)
ultrathin body and buried oxide fully depleted silicon on insulator (UTBB FDSOI)
Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs
期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 3, 页码: 13
作者:
Ke, Lingyun
;
Zhao, Peixiong
;
Liu, Jie
;
Fan, Xue
;
Cai, Chang
收藏
  |  
浏览/下载:108/0
  |  
提交时间:2019/11/10
FPGA
radiation hardening
single event upsets
heavy ions
error rates
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Fang, Xiangsheng
;
Zhang, Jiliang
;
Cui, Jie
;
Huang, Zhengfeng
;
Yang, Kang
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2019/04/24
Circuit
reliability
radiation
hardening
soft
error
double-node
upset
single
node
upset
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE Transactions on Circuits and Systems II: Express Briefs, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Aibin Yan
;
Kang Yang
;
Zhengfeng Huang
;
Jiliang Zhang
;
Jie Cui
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2019/12/13
Latches
Radiation hardening (electronics)
Clocks
Feedback loop
Power dissipation
Reliability
Electronic mail
Circuit reliability
radiation hardening
soft error
double-node upset
single node upset
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Yan, AB
;
Yang, K
;
Huang, ZF
;
Zhang, JL
;
Cui, J
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2019/12/17
Circuit reliability
radiation hardening
soft error
double-node upset
single node upset
An Adaptive Single Event Upset (SFU)-Hardened Flip-Flop Design
会议论文
2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2019-01-01
作者:
Zhang, Man
;
Guo, ZhongJie
;
Xu, WanCheng
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/20
single event upset (SET)
flip-flop
radiation hardening
LOCld65, a Dual-Channel VCSEL Driver ASIC for Detector Front-End Readout
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 7, 页码: 1115-1122
作者:
Zhou, Wei
;
Gong, Datao
;
Sun, Quan
;
Guo, Di
;
Huang, Guangming
收藏
  |  
浏览/下载:44/0
  |  
提交时间:2019/12/23
Analog integrated circuits
application-specific integrated circuits
high energy physics instrumentation computing
Large Hadron Collider (LHC)
optical transmitters
radiation hardening (electronics)
Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 页码: 1853-1862
作者:
Wang, Bi
;
Wang, Zhaohao
;
Wu, Bi
;
Bai, Yumeng
;
Cao, Kaihua
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2019/12/30
SOT-MRAM
radiation hardening techniques
single event upset
double-node upset
particle
reliability
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