| A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application | |
| Fang, Xiangsheng; Zhang, Jiliang; Cui, Jie; Huang, Zhengfeng; Yang, Kang; Wen, Xiaoqing; Yi, Maoxiang; Yan, Aibin | |
| 刊名 | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
 |
| 2019 | |
| 卷号 | Vol.66 No.2页码:287-291 |
| 关键词 | Circuit reliability radiation hardening soft error double-node upset single node upset |
| ISSN号 | 1549-7747 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2205703 |
| 专题 | 安徽大学 |
| 作者单位 | 1.Anhui Univ, Sch Comp Sci & Technol, Hefei 230601, Anhui, Peoples R China 2.Hefei Univ Technol, Sch Elect Sci & Appl Phys, Hefei 230009, Anhui, Peoples R China 3.Kyushu Inst Technol, Dept Creat Informat, Fukuoka, Fukuoka 8208502, Japan 4.Kyushu Inst Technol, Grad Sch Comp Sci & Syst Engn, Fukuoka, Fukuoka 8208502, Japan 5.Hunan Univ, Coll Comp Sci & Elect Engn, Changsha 410082, Hunan, Peoples R China |
| 推荐引用方式 GB/T 7714 | Fang, Xiangsheng,Zhang, Jiliang,Cui, Jie,et al. A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS,2019,Vol.66 No.2:287-291. |
| APA | Fang, Xiangsheng.,Zhang, Jiliang.,Cui, Jie.,Huang, Zhengfeng.,Yang, Kang.,...&Yan, Aibin.(2019).A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS,Vol.66 No.2,287-291. |
| MLA | Fang, Xiangsheng,et al."A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application".IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS Vol.66 No.2(2019):287-291. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论