×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
长春光学精密机械与物... [2]
力学研究所 [1]
内容类型
会议论文 [2]
期刊论文 [1]
发表日期
2022 [1]
2011 [1]
2005 [1]
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共3条,第1-3条
帮助
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
Analysis on the Mechanical Behavior of Flexible Screens
期刊论文
MATERIALS, 2022, 卷号: 15, 期号: 8, 页码: 14
作者:
Niu, Lirui
;
Ding, Jun
;
Liu W(刘巍)
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2022/05/17
OLED flexible screen
bending radius
thickness of the shape
water-drop-shaped
Effect of thickness on the structural, electrical and optical properties of ZnO films deposited by MBE (EI CONFERENCE)
会议论文
2011 International Conference on Advanced Design and Manufacturing Engineering, ADME 2011, September 16, 2011 - September 18, 2011, Guangzhou, China
Yang X.
;
Su S.
;
Yi X.
;
Mei T.
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2013/03/25
A set of ZnO films of different thickness have been deposited on sapphire substrates using molecular beam epitaxy (MBE) by varying the growth time and the effect of film thickness on the structural
electrical and optical properties have been investigated. The X-ray diffraction (XRD) results indicate that the full width at half maximum (FWHM) of the (002) diffraction peak is decreased as the film thickness increasing
and the stress along c-axis is stable. Scanning electron microscope (SEM) measurement shows that the grains become more uniform as the film grows thicker and the film surface present distinct hexagon shape as the film is grown up to a thickness of 500nm. The optical absorbance
Hall mobility and photoluminescence (PL) intensity are increased in accordance with the thickness of the film. (2011) Trans Tech Publications
Switzerland.
The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE)
会议论文
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China
Wu X.
;
Lei F.
;
Yatagai T.
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2013/03/25
We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film
the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change
the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.
©版权所有 ©2017 CSpace - Powered by
CSpace