CORC

在结果中检索

CORC

浏览/检索结果: 共637条，第1-10条 帮助

已选(0)清除 条数/页：   排序方式：
Single event transient effect of frontside and backside illumination image sensors under proton irradiation 期刊论文
ACTA PHYSICA SINICA, 2022, 卷号: 71, 期号: 5, 页码: 1-9
作者:  Fu, J (Fu Jing) [1] , [2] , [3];  Cai, YL (Cai Yu-Long) [4];  Li, YD (Li Yu-Dong) [1] , [2];  Feng, J (Feng Jie) [1] , [2];  Wen, L (Wen Lin) [1] , [2]
收藏  |  浏览/下载：20/0  |  提交时间：2022/06/06
Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文
CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184
作者:  Liu, BK (Liu Bingkai)[ 1,2,3 ];  Li, YD (Li Yudong)[ 1,2 ];  Wen, L (Wen Lin)[ 1,2 ];  Zhou, D (Zhou Dong)[ 1,2 ];  Feng, J (Feng Jie)[ 1,2 ]
收藏  |  浏览/下载：31/0  |  提交时间：2021/05/10
Mechanism of Ionization Damage in Large Eight-Transistor Complementary Metal-Oxide-Semiconductor Color Image Sensors 期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2021, 卷号: 16, 期号: 11, 页码: 1755-1761
作者:  Feng, J (Feng, Jie) [1] , [2];  Fu, J (Fu, Jing) [1] , [2] , [3];  Li, YD (Li, Yu-Dong) [1] , [2];  Wen, L (Wen, Lin) [1] , [2];  Guo, Q (Guo, Qi) [1] , [2]
收藏  |  浏览/下载：22/0  |  提交时间：2022/03/24
Radiation Effects and Mechanisms on Switching Characteristics of Silicon Carbide Power MOSFETs 期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2021, 卷号: 16, 期号: 9, 页码: 1423-1429
作者:  Feng, HN (Feng, Haonan) [1] , [2] , [3];  Yang, S (Yang, Sheng) [1] , [2] , [3];  Liang, XW (Liang, Xiaowen) [1] , [2] , [3];  Zhang, D (Zhang, Dan) [1] , [2] , [3];  Pu, XJ (Pu, Xiaojuan) [1] , [2] , [3]
收藏  |  浏览/下载：40/0  |  提交时间：2022/03/24
Aptamer-Modified Silver Nanoclusters for Fluorescence Detection of Intracellular 8-Hydroxydeoxyguanosine 期刊论文
ACS APPLIED NANO MATERIALS, 2020, 卷号: 3, 期号: 2, 页码: 1332-1338
作者:  Lan, JZ (Lan, Jinze)[ 2,3 ];  Feng, B (Feng, Bo)[ 3 ];  Wu, XX (Wu, Xiaoxia)[ 3 ];  Yang, LY (Yang, Lingyan)[ 3 ];  Liu, J (Liu, Jing)[ 3 ]
收藏  |  浏览/下载：22/0  |  提交时间：2020/05/07
A study of hot pixels induced by proton and neutron irradiations in charge coupled devices 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550
作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]
收藏  |  浏览/下载：42/0  |  提交时间：2020/07/06
Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 8, 页码: 1861-1868
作者:  Cai, YL (Cai, Yulong)[ 1,2 ];  Wen, L (Wen, Lin)[ 3 ];  Li, YD (Li, Yudong)[ 3 ];  Guo, Q (Guo, Qi)[ 3 ];  Zhou, D (Zhou, Dong)[ 3 ]
收藏  |  浏览/下载：24/0  |  提交时间：2020/09/09
Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors 期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020, 卷号: 57, 期号: 9, 页码: 1015-1021
作者:  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ]
收藏  |  浏览/下载：21/0  |  提交时间：2020/12/09
Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors 期刊论文
RESULTS IN PHYSICS, 2020, 卷号: 19, 期号: 12, 页码: 1-7
作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]
收藏  |  浏览/下载：18/0  |  提交时间：2021/03/19
One-pot synthesis of unprotected PtPd nanoclusters with enhanced catalytic activity, durability, and methanol-tolerance for oxygen reduction reaction 期刊论文
APPLIED SURFACE SCIENCE, 2019, 卷号: 473, 期号: 4, 页码: 318-325
作者:  Liu, J (Liu, Jing)[ 1,2,4 ];  Yin, J (Yin, Jiao)[ 1,2 ];  Feng, B (Feng, Bo)[ 1,2 ];  Li, F (Li, Fan)[ 1,2 ];  Wang, F (Wang, Fu)[ 1,2,3 ]
收藏  |  浏览/下载：88/0  |  提交时间：2019/02/25

©版权所有 ©2017 CSpace - Powered by CSpace