A study of hot pixels induced by proton and neutron irradiations in charge coupled devices

doi:10.1080/10420150.2019.1701470

CORC > 新疆理化技术研究所 > 中国科学院新疆理化技术研究所 > 中国科学院特殊环境功能材料与器件重点试验室

	A study of hot pixels induced by proton and neutron irradiations in charge coupled devices
	Liu, BK (Liu, Bingkai)[ 1,2,3 ]; Li, YD (Li, Yudong)[ 1,2 ]; Wen, L (Wen, Lin)[ 1,2 ]; Zhou, D (Zhou, Dong)[ 1,2 ]; Feng, J (Feng, Jie)[ 1,2 ]; Ma, LD (Ma, Lindong)[ 1,2,3 ]; Zhang, X (Zhang, Xiang)[ 1,2,3 ]; Cai, YL (Cai, Yulong)[ 1,2,3 ]; Wang, ZM (Wang, Zhiming)[ 1,2,3 ]; Fu, J (Fu, Jing)[ 1,2,3 ]
刊名	RADIATION EFFECTS AND DEFECTS IN SOLIDS
	2020
卷号	175 期号:5-6 页码:540-550
关键词	Charge coupled devices (CCDs) proton irradiation neutron irradiation hot pixels displacement damage effects
ISSN号	1042-0150
DOI	10.1080/10420150.2019.1701470
英文摘要	Charge coupled devices with high sensitivity and low dark current were irradiated separately by 10 MeV proton, 14 and 1 MeV neutron up to the fluences of 10(9) cm(-)(2). The generation pattern of hot pixels at different conditions is presented. The experimental results demonstrate that the nuclear inelastic scattering is the dominant generation mechanism of hot pixels induced by proton and neutron irradiations. Meanwhile, a theoretical model is used to predict hot pixel tails at different annealing time points and different operating temperatures.
WOS记录号	WOS:000532610100013
内容类型	期刊论文
源URL	[http://ir.xjipc.cas.cn/handle/365002/7368]
专题	新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室
通讯作者	Li, YD (Li, Yudong)[ 1,2 ]
作者单位	1.Chinese Acad Sci, Shanghai Inst Tech Phys, Key Lab Infrared Imaging Mat & Detectors, Shanghai, Peoples R China 2.Univ Chinese Acad Sci, Beijing, Peoples R China 3.Xinjiang Key Lab Elect Informat Mat & Device, Urumqi, Peoples R China 4.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi, Peoples R China
推荐引用方式 GB/T 7714	Liu, BK ,Li, YD ,Wen, L ,et al. A study of hot pixels induced by proton and neutron irradiations in charge coupled devices[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS,2020,175(5-6):540-550.
APA	Liu, BK .,Li, YD .,Wen, L .,Zhou, D .,Feng, J .,...&Ma, D .(2020).A study of hot pixels induced by proton and neutron irradiations in charge coupled devices.RADIATION EFFECTS AND DEFECTS IN SOLIDS,175(5-6),540-550.
MLA	Liu, BK ,et al."A study of hot pixels induced by proton and neutron irradiations in charge coupled devices".RADIATION EFFECTS AND DEFECTS IN SOLIDS 175.5-6(2020):540-550.