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浏览/检索结果: 共5条，第1-5条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文 CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184 作者:  Liu, BK (Liu Bingkai)[ 1,2,3 ];  Li, YD (Li Yudong)[ 1,2 ];  Wen, L (Wen Lin)[ 1,2 ];  Zhou, D (Zhou Dong)[ 1,2 ];  Feng, J (Feng Jie)[ 1,2 ] 收藏  |  浏览/下载：31/0  |  提交时间：2021/05/10 Backside‐  illuminated CMOS image sensors  Dark signal behaviors  Displacement damage effects  Neutron irradiation   Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors 期刊论文 JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020, 卷号: 57, 期号: 9, 页码: 1015-1021 作者:  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ] 收藏  |  浏览/下载：21/0  |  提交时间：2020/12/09 14-MeV neutron  neutron irradiation  radiation damage  radiation effect   Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors 期刊论文 RESULTS IN PHYSICS, 2020, 卷号: 19, 期号: 12, 页码: 1-7 作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ] 收藏  |  浏览/下载：18/0  |  提交时间：2021/03/19 Backside illuminated CMOS image sensor  Random telegraph signal  Radiation effects  Proton irradiation  Theoretical calculation   High resolution electron bombareded complementary metal oxide semiconductor sensor for ultraviolet detection 期刊论文 ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 1 作者:  Liu Hu-Lin;  Wang Xing;  Tian Jin-Shou;  Sai Xiao-Feng;  Wei Yong-Lin 收藏  |  浏览/下载：61/0  |  提交时间：2018/12/11 Complementary Metal Oxide Semiconductor  Electron Bombareded Gain  Low Light Level Imaging  Uv Detection   Radiation Effects Due to 3 MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors 期刊论文 CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 7, 页码: 1-4 作者:  Zhang, X (Zhang, Xiang);  Li, YD (Li, Yu-Dong);  Wen, L (Wen, Lin);  Zhou, D (Zhou, Dong);  Feng, J (Feng, Jie) 收藏  |  浏览/下载：31/0  |  提交时间：2018/08/14