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科研机构
兰州理工大学 [2]
合肥物质科学研究院 [2]
力学研究所 [1]
金属研究所 [1]
内容类型
期刊论文 [5]
会议论文 [1]
发表日期
2020 [6]
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Transverse-pressure susceptibility of high-J(c) RRP and PIT types of Nb3Sn Rutherford cables for accelerator magnets
期刊论文
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2020, 卷号: 33
作者:
Gao, P.
;
Dhalle, M.
;
Bordini, B.
;
Ballarino, A.
;
Ten Kate, H. H. J.
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2020/12/28
RRP and PIT Nb3Sn wire
Rutherford cable
transverse pressure
critical current degradation
Magnetic properties of La0.7Sr0.3MnO3 under the pressure and the transport property under the magnetic field
期刊论文
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2020
作者:
Zhang, Xian
;
Han, YuYan
;
Kan, Xucai
;
Wang, Min
;
Rao, Rui
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2020/11/30
double exchange
Jahn-Teller distortion
La0.7Sr0.3MnO3
magnetic properties
pressure
Assessing the Effect of the Electron-Beam Irradiation on Pd/Ga(2)O(3)Catalyst under Ambient Pressure
期刊论文
CHEMCATCHEM, 2020, 页码: 6
作者:
Wang, Yongzhao
;
Niu, Yiming
;
Gao, Tongtong
;
Liu, Siyang
;
Zhang, Bingsen
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2021/02/02
in-situ transmission electron microscopy
Pd
Ga2O3
electron-beam irradiation damage
ambient pressure
metal-support interaction
Development and application of ANN model for property prediction of supercritical kerosene
期刊论文
Computers and Fluids, 2020, 卷号: 209, 期号: 2020, 页码: 1-18
作者:
Li B(李波)
;
Lee YC(李亚超)
;
Yao W(姚卫)
;
Fan XJ(范学军)
收藏
  |  
浏览/下载:88/0
  |  
提交时间:2020/08/27
Artificial Neural Network (Ann)
Principle Of Extended Corresponding State (Ecs)
Rp-3 Kerosene
Superitical Pressure
Openfoam
Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects
会议论文
作者:
Geng, W.R.
;
Tian, X.H.
;
Jiang, Y.X.
;
Zhu, Y.L.
;
Tang, Y.L.
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2020/12/18
Bismuth compounds
Defects
Domain walls
Electric field measurement
Electronic states
Ferroelectric materials
Film growth
High resolution transmission electron microscopy
Interface states
Iron compounds
Modulation
Oxygen
Scanning electron microscopy
Thin films
TransmissionsAberration-corrected scanning transmission electron microscopies
BiFeO3 thin film
Charged domain wall
Electronics devices
Oxygen pressure
Phase-field simulation
Theoretical simulation
Vacancy Defects
Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects
期刊论文
Acta Materialia, 2020, 卷号: 186, 页码: 68-76
作者:
Geng, W.R.
;
Tian, X.H.
;
Jiang, Y.X.
;
Zhu, Y.L.
;
Tang, Y.L.
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2020/11/14
Bismuth compounds
Defects
Domain walls
Electric field measurement
Electronic states
Ferroelectric materials
Film growth
High resolution transmission electron microscopy
Interface states
Iron compounds
Modulation
Oxygen
Scanning electron microscopy
Thin films
Transmissions
Aberration-corrected scanning transmission electron microscopies
BiFeO3 thin film
Charged domain wall
Electronics devices
Oxygen pressure
Phase-field simulation
Theoretical simulation
Vacancy Defects
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