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浏览/检索结果: 共7条，第1-7条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 Coexisting morphotropic phase boundary and giant strain gradient in BiFeO3films 期刊论文 Journal of Applied Physics, 2021, 卷号: 129, 期号: 18 作者:  Tang, Y.L.;  Zhu, Y.L.;  Zou, M.J.;  Wang, Y.J.;  Ma, X.L. 收藏  |  浏览/下载：8/0  |  提交时间：2022/02/17 Bismuth compounds  Electric fields  High resolution transmission electron microscopy  Iron metallography  Oxide films  Perovskite  Polarization  Scanning electron microscopy  Strain  Aberration-corrected scanning transmission electron microscopies  Built-in electric fields  Large compressive strains  Morphotropic phase boundaries  Piezoelectric response  Polarization direction  Spontaneous polarizations  Tetragonal and rhombohedral phasis   Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects 期刊论文 ACTA MATERIALIA, 2020, 卷号: 186, 页码: 68-76 作者:  Geng, W. R.;  Tian, X. H.;  Jiang, Y. X.;  Zhu, Y. L.;  Tang, Y. L. 收藏  |  浏览/下载：8/0  |  提交时间：2021/02/02 BiFeO3 films  Oxygen vacancy plates  Charged domain wall pinning  Aberration-corrected scanning transmission electron microscopies  Phase field simulations   Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects 会议论文 作者:  Geng, W.R.;  Tian, X.H.;  Jiang, Y.X.;  Zhu, Y.L.;  Tang, Y.L. 收藏  |  浏览/下载：2/0  |  提交时间：2020/12/18 Bismuth compounds  Defects  Domain walls  Electric field measurement  Electronic states  Ferroelectric materials  Film growth  High resolution transmission electron microscopy  Interface states  Iron compounds  Modulation  Oxygen  Scanning electron microscopy  Thin films  TransmissionsAberration-corrected scanning transmission electron microscopies  BiFeO3 thin film  Charged domain wall  Electronics devices  Oxygen pressure  Phase-field simulation  Theoretical simulation  Vacancy Defects   Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects 期刊论文 Acta Materialia, 2020, 卷号: 186, 页码: 68-76 作者:  Geng, W.R.;  Tian, X.H.;  Jiang, Y.X.;  Zhu, Y.L.;  Tang, Y.L. 收藏  |  浏览/下载：2/0  |  提交时间：2020/11/14 Bismuth compounds  Defects  Domain walls  Electric field measurement  Electronic states  Ferroelectric materials  Film growth  High resolution transmission electron microscopy  Interface states  Iron compounds  Modulation  Oxygen  Scanning electron microscopy  Thin films  Transmissions  Aberration-corrected scanning transmission electron microscopies  BiFeO3 thin film  Charged domain wall  Electronics devices  Oxygen pressure  Phase-field simulation  Theoretical simulation  Vacancy Defects   Mapping gradient-driven morphological phase transition at the conductive domain walls of strained multiferroic films 期刊论文 PHYSICAL REVIEW B, 2019, 卷号: 100, 期号: 10 作者:  Han, M. J.;  Eliseev, E. A.;  Morozovska, A. N.;  Zhu, Y. L.;  Tang, Y. L. 收藏  |  浏览/下载：2/0  |  提交时间：2019/11/15 Bismuth compounds  Electronic properties  Ferroelectric materials  High resolution transmission electron microscopy  Iron compounds  Multiferroics  Perovskite  Scanning electron microscopy  Transmissions  Aberration-corrected scanning transmission electron microscopies  Experimental evidence  Functional manipulation  High resolution scanning transmission electron microscopies  Intrinsic mechanisms  Nanoscale electronic devices  Structural distortions  Technological communities   Anisotropic strain: A critical role in domain evolution in (111)- Oriented ferroelectric films 期刊论文 Acta Materialia, 2019, 卷号: 166, 页码: 503-511 作者:  Zou, M.J.;  Tang, Y.L.;  Zhu, Y.L.;  Feng, Y.P.;  Wang, Y.J. 收藏  |  浏览/下载：7/0  |  提交时间：2020/11/14 Anisotropy  Domain walls  Ferroelectric materials  Ferroelectricity  Film thickness  Gadolinium compounds  High resolution transmission electron microscopy  Lead titanate  Perovskite  Polarization  Scanning probe microscopy  Strain  Transmission electron microscopy  Transmissions  Aberration-corrected  Ferroelectric domains  Ferroelectric property  In-plane polarization  PbTiO3  Piezoresponse force microscopy  Polarization direction  Transmission electronic microscopies   Atomic mapping of structural distortions in 109° domain patterned BiFeO3 thin films 期刊论文 Journal of Materials Research, 2017, 卷号: 32, 期号: 12, 页码: 2423-2430 作者:  Wang, Wen-Yuan;  Zhu, Yin-Lian;  Tang, Yun-Long;  Han, Meng-Jiao;  Wang, Yu-Jia 收藏  |  浏览/下载：0/0  |  提交时间：2020/11/14 Bismuth compounds  Domain walls  Ferroelectric films  Ferroelectric materials  Ferroelectricity  Films  High resolution transmission electron microscopy  Interface states  Iron compounds  Nanotechnology  Scanning electron microscopy  Tensile strain  Transmission electron microscopy  Aberration-corrected scanning transmission electron microscopies  External boundary conditions  External constraints  Film/substrate interface  Out-of-plane lattices  Rhombohedral distortion  Structural distortions  Structural parameter