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CORC

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Combined Frequency- and Time-Domain Photocarrier Radiometry Characterization for Annealing Temperature Dependence of Arsenic Ion-Implanted Silicon Wafers 期刊论文
INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2015, 卷号: 36, 期号: 5-6, 页码: 1045-1050
作者:  Ren, Shengdong;  Li, Bincheng;  Wang, Qian
收藏  |  浏览/下载：22/0  |  提交时间：2015/09/21
Photocarrier Radiometry Characterization of Ultra-shallow Junctions (USJ) in Silicon with Excimer Laser Irradiation 期刊论文
INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2015, 卷号: 36, 期号: 5-6, 页码: 1173-1180
作者:  Wang, Qian;  Li, Bincheng;  Ren, Shengdong;  Wang, Qiang
收藏  |  浏览/下载：13/0  |  提交时间：2015/09/21
Combined Frequency- and Time-Domain Photocarrier Radiometry Characterization for Annealing Temperature Dependence of Arsenic Ion-Implanted Silicon Wafers 期刊论文
International Journal of Thermophysics, 2015, 卷号: 36, 期号: 5-6, 页码: 1045-1050
作者:  Ren, Shengdong;  Li, Bincheng;  Wang, Qian
收藏  |  浏览/下载：16/0  |  提交时间：2016/11/21
Photocarrier Radiometry Characterization of Ultra-shallow Junctions (USJ) in Silicon with Excimer Laser Irradiation 期刊论文
International Journal of Thermophysics, 2015, 卷号: 36, 期号: 5-6, 页码: 1173-1180
作者:  Wang, Qian;  Li, Bincheng;  Ren, Shengdong;  Wang, Qiang
收藏  |  浏览/下载：11/0  |  提交时间：2016/11/21
Characterization of Silicon Wafers with Combined Photocarrier Radiometry and Free Carrier Absorption 期刊论文
INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2013, 卷号: 34, 期号: 8-9, 页码: 1735-1745
作者:  Li, Bincheng;  Huang, Qiuping;  Ren, Shengdong
收藏  |  浏览/下载：22/0  |  提交时间：2015/04/17
Optical and photo-carrier characterization of ultra-shallow junctions in silicon 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2013, 卷号: 56, 期号: 7, 页码: 1294-1300
作者:  Huang QiuPing;  Li BinCheng;  Ren ShengDong
收藏  |  浏览/下载：20/0  |  提交时间：2015/04/17
Combined frequency- and time-domain photocarrier radiometry characterization of ion-implanted and thermally annealed silicon wafers 期刊论文
CHINESE PHYSICS B, 2013, 卷号: 22, 期号: 5
作者:  Ren Sheng-Dong;  Li Bin-Cheng;  Gao Li-Feng;  Wang Qian
收藏  |  浏览/下载：12/0  |  提交时间：2015/04/17
Optical and photo-carrier characterization of ultra-shallow junctions in silicon 期刊论文
Science China: Physics, Mechanics and Astronomy, 2013, 卷号: 56, 期号: 7, 页码: 1294-1300
作者:  Huang, Qiuping;  Li, Bincheng;  Ren, Shengdong
收藏  |  浏览/下载：11/0  |  提交时间：2016/11/21
Combined frequency- and time-domain photocarrier radiometry characterization of ion-implanted and thermally annealed silicon wafers 期刊论文
Chinese Physics B, 2013, 卷号: 22, 期号: 5, 页码: 057202
作者:  Ren, Sheng-Dong;  Li, Bin-Cheng;  Gao, Li-Feng;  Wang, Qian
收藏  |  浏览/下载：13/0  |  提交时间：2016/11/21
Characterization of silicon wafers with combined photocarrier radiometry and free carrier absorption 期刊论文
International Journal of Thermophysics, 2013, 卷号: 34, 期号: 8-9, 页码: 1735-1745
作者:  Li, Bincheng;  Huang, Qiuping;  Ren, Shengdong
收藏  |  浏览/下载：14/0  |  提交时间：2016/11/21

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