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Hole mobility enhancement of pMOSFETs with strain channel induced by ge pre-amorphization implantation for source/drain extension 外文期刊
2006
作者:  Xu, QX;  Duan, XF;  Qian, H;  Liu, HH;  Li, HO
收藏  |  浏览/下载:12/0  |  提交时间:2010/11/26
Nanoscale strain analysis of strained-Si metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 外文期刊
2006
作者:  Liu, HH;  Duan, XF;  Qi, XY;  Xu, QX;  Li, HO
收藏  |  浏览/下载:15/0  |  提交时间:2010/11/26
Growth and characterization of 0.8-mu m gate length AlGaN/GaN HEMTs on sapphire substrates 外文期刊
2005
作者:  Wang, XL;  Wang, CM;  Hu, GX;  Wang, JX;  Ran, JX
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/26
Characterization of 1.9-and 1.4-nm ultrathin gate oxynitride by oxidation of nitrogen-implanted silicon substrate 外文期刊
2004
作者:  Xu, QX;  Qian, H;  Han, ZS;  Lin, G;  Liu, M
收藏  |  浏览/下载:6/0  |  提交时间:2010/11/26
The investigation of key technologies for sub-0.1-mu m CMOS device fabrication 外文期刊
2001
作者:  Xu, QX;  Qian, H;  Yin, HX;  Jia, L;  Ji, HH
收藏  |  浏览/下载:19/0  |  提交时间:2010/11/26


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