CORC

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Study of GaN thin films grown on vicinal SiC (0001) substrates by molecular beam epitaxy 期刊论文
semiconductor science and technology, 2002, 卷号: 17, 期号: 9, 页码: 957-960
Lu LW; Yan H; Yang CL; Xie MH; Wang ZG; Wang J; Ge WK
收藏  |  浏览/下载:51/0  |  提交时间:2010/08/12
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/15
Characterization of diphasic nc-Si/a-Si : H thin films and solar cells 会议论文
29th ieee photovoltaic specialists conference, new orleans, la, may 19-24, 2002
Zhang SB; Xu YY; Hu ZH; Wang YQ; Zeng XB; Diao HW; Wang WJ; Kong GL; Liao XB
收藏  |  浏览/下载:22/7  |  提交时间:2010/10/29
SILICON  RAMAN  
Improved Epitaxy of 3C-SiC Layers on Si(100) by New CVD/LPCVD System 期刊论文
半导体学报, 2002, 卷号: 23, 期号: 8, 页码: 800-804
Sun Guosheng; Wang Lei; Luo Muchang; Zhao Wanshun; Sun Dianzhao; Zeng Yiping; Li Jinmin; Lin Lanying
收藏  |  浏览/下载:20/0  |  提交时间:2010/11/23
Structural properties and Raman measurement of AlN films grown on Si (111) by NH3-GSMBE 期刊论文
journal of crystal growth, 2002, 卷号: 244, 期号: 3-4, 页码: 229-235
Luo MC; Wang XL; Li JM; Liu HX; Wang L; Sun DZ; Zeng YP; Lin LY
收藏  |  浏览/下载:36/0  |  提交时间:2010/08/12
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 期刊论文
materials science and engineering b-solid state materials for advanced technology, 2002, 卷号: 91, 期号: 0, 页码: 521-524
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:82/19  |  提交时间:2010/08/12


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