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大连理工大学 [2]
兰州理工大学 [1]
华南理工大学 [1]
武汉大学 [1]
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会议论文 [5]
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2018 [1]
2017 [2]
2014 [1]
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Growth Behavior of Cu6Sn5 Grains at Sn/(001)Cu Interface by Imposing Temperature Gradient
会议论文
2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2018-01-01
作者:
Zhao, Ning
;
Chen, Shi
;
Liu, Chunying
;
Zhong, Yi
;
Ma, Haitao
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/02
3D packaging
Cu6Sn5
regular grains
anisotropy
temperature gradient
Fabrication of embedded piezoelectric sensors and its application in traffic engineering
会议论文
Singapore, Singapore, September 1, 2017 - September 3, 2017
作者:
Zhang, Xingjun
;
Song, Shanglin
;
Yao, Ming Jie
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2020/11/15
3D printers
Aggregates
Composite materials
Concrete aggregates
Concrete buildings
Concrete construction
Electric sensing devices
Epoxy resins
Glass ceramics
Highway engineering
Mean square error
Monitoring
Packaging materials
Piezoelectric ceramics
Piezoelectric devices
Piezoelectric transducers
Piezoelectricity
Structural health monitoring
Traffic control
Health monitoring
Piezoelectric sensors
Service performance
Traffic monitoring
Working performance
DEVELOPMENT OF WAFER LEVEL HYBRID BONDING PROCESS USING PHOTOSENSITIVE ADHESIVE AND CU PILLAR BUMP
会议论文
China Semiconductor Technology International Conference (CSTIC), Shanghai, PEOPLES R CHINA, 2017-03-12
作者:
Yao, Mingjun
;
Yu, Daquan
;
Zhao, Ning
;
Fan, Jun
;
Xiao, Zhiyi
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/02
Hybrid bonding
3D packaging
Bump
Polyimide
Dry film
Research on nano-thermocompression bonding process using nanoporous copper as bonding layer
会议论文
作者:
Li, Kecheng
;
Liu, Xiaogang
;
Chen, Mingxiang
;
Liu, Sheng
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/05
3D packaging
low temperature bonding
nano-thermocompression bonding
nanoporous copper
process optimization
Influence of Geometry of Microbump Interconnects on Thermal Stress and Fatigue Life of Interconnects in Copper Filled Through Silicon Via Str (CPCI-S收录)
会议论文
2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)
作者:
Qin, Hong-Bo[1]
;
Yuwen, Hui-Hui[1]
;
Zhou, Min-Bo[1]
;
Zhang, Xin-Ping[1]
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/15
TSV
3D packaging
microbump interconnect
fatigue life
finite element simulation
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