CORC

浏览/检索结果: 共4条,第1-4条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
FOI FinFET with Ultra-low Parasitic Resistance Enabled by Fully Metallic Source and Drain Formation on Isolated Bulk-Fin 会议论文
作者:  Wu ZH(吴振华);  Luo J(罗军);  Meng LK(孟令款);  Zhang QZ(张青竹);  Li YD(李昱东)
收藏  |  浏览/下载:32/0  |  提交时间:2017/05/19
Study of SiGe selective epitaxial process integration with high-k and metal gate for 16/14 nm nodes FinFET technology 期刊论文
Microelectronics Engineering, 2016
作者:  Wang GL(王桂磊);  Qin ZL(秦长亮);  Yin HX(殷华湘);  Duan NY(段宁远);  Yang T(杨涛)
收藏  |  浏览/下载:9/0  |  提交时间:2017/05/09
Integration of Selective Epitaxial Growth of SiGe/Ge layers in 14nm Node FinFETs 期刊论文
ECS Transactions, 2016
作者:  Yin HX(殷华湘);  Wang GL(王桂磊);  Luo J(罗军);  Qin ZL(秦长亮);  Cui HS(崔虎山)
收藏  |  浏览/下载:16/0  |  提交时间:2017/05/09
SiGe Selective Epitaxial Growth Process for 22 nm Node CMOS and Beyond 期刊论文
The Electrochemical Society, 2014
作者:  Xu Q(徐强);  Wang GL(王桂磊);  Ye TC(叶甜春);  Luo J(罗军);  Li CL(李春龙)
收藏  |  浏览/下载:14/0  |  提交时间:2015/04/24


©版权所有 ©2017 CSpace - Powered by CSpace