×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
北京大学 [30]
内容类型
其他 [30]
发表日期
2016 [2]
2015 [6]
2014 [4]
2013 [4]
2012 [3]
2011 [2]
更多...
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共30条,第1-10条
帮助
限定条件
内容类型:其他
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects
其他
2016-01-01
Ren, Pengpeng
;
Xu, Xiaoqing
;
Hao, Peng
;
Wang, Junyao
;
Wang, Runsheng
;
Li, Ming
;
Wang, Jianping
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Pan, David Z.
;
Huang, Ru
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2017/12/03
Deep Insights into Dielectric Breakdown in Tunnel FETs with Awareness of Reliability and Performance Co-Optimization
其他
2016-01-01
Huang, Qianqian
;
Jia, Rundong
;
Zhu, Jiadi
;
Lv, Zhu
;
Wang, Jiaxin
;
Chen, Cheng
;
Zhao, Yang
;
Wang, Runsheng
;
Bu, Weihai
;
Wang, Wenbo
;
Kang, Jin
;
Hua, Kelu
;
Wu, Hanming
;
Yu, Shaofeng
;
Wang, Yangyuan
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Impact of Temporal Transistor Variations on Circuit Reliability
其他
2015-01-01
Wang, Runsheng
;
Cao, Yu
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
circuit reliability
temporal variation
bias temperature instability (BTI)
random telegraph noise (RTN)
Duty Cycle Shift under Static/Dynamic Aging in 28nm HK-MG Technology
其他
2015-01-01
Sutaria, Ketul B.
;
Ren, Pengpeng
;
Mohanty, Abinash
;
Feng, Xixiang
;
Wang, Runsheng
;
Huang, Ru
;
Cao, Yu
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
Aging
NBTI
PBTI
Duty Cycle Shift
BTI
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era
其他
2015-01-01
Ren, Pengpeng
;
Wang, Runsheng
;
Ji, Zhigang
;
Hao, Peng
;
Jiang, Xiaobo
;
Guo, Shaofeng
;
Luo, Mulong
;
Duan, Meng
;
Zhang, Jian F.
;
Wang, Jianping
;
Liu, Jinhua
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Xu, Nuo
;
Huang, Ru
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits
其他
2015-01-01
Zou, Jibin
;
Wang, Runsheng
;
Guo, Shaofeng
;
Luo, Mulong
;
Yu, Zhuoqing
;
Jiang, Xiaobo
;
Ren, Pengpeng
;
Wang, Jianping
;
Liu, Jinhua
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Wang, Yangyuan
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design
其他
2015-01-01
Guo, Shaofeng
;
Huang, Ru
;
Hao, Peng
;
Luo, Mulong
;
Ren, Pengpeng
;
Wang, Jianping
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Scott
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Wang, Runsheng
;
Wang, Yangyuan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
Adding the Missing Time-Dependent Layout Dependency into Device-Circuit-Layout Co-Optimization -New Findings on the Layout Dependent Aging Effects
其他
2015-01-01
Ren, Pengpeng
;
Xu, Xiaoqing
;
Hao, Peng
;
Wang, Junyao
;
Wang, Runsheng
;
Li, Ming
;
Wang, Jianping
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Pan, David Z.
;
Huang, Ru
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
Diagnosing bias runaway in analog/mixed signal circuits
其他
2014-01-01
Sutaria, Ketul B.
;
Ren, Pengpeng
;
Ramkumar, Athul
;
Zhu, Rongjun
;
Feng, Xixiang
;
Wang, Runsheng
;
Huang, Ru
;
Cao, Yu
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2015/11/13
New Efficient Method for Characterizing Time Constants of Switching Oxide Traps
其他
2014-01-01
Guo, Shaofeng
;
Ren, Pengpeng
;
Wang, Runsheng
;
Yu, Zhuoqing
;
Luo, Mulong
;
Zhang, Xing
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2015/11/13
MOSFETs
switching oxide traps
time constants
characterizing method
MC simulation
©版权所有 ©2017 CSpace - Powered by
CSpace