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	New Efficient Method for Characterizing Time Constants of Switching Oxide Traps
	Guo, Shaofeng ; Ren, Pengpeng ; Wang, Runsheng ; Yu, Zhuoqing ; Luo, Mulong ; Zhang, Xing ; Huang, Ru
	2014
关键词	MOSFETs switching oxide traps time constants characterizing method MC simulation
英文摘要	In this paper, a new method named Incremental Trap-Response (ITR) is proposed for characterizing the time constants of switching oxide traps, which can be used to expand the voltage detectable window of RTN. Both theoretical and experimental results demonstrate that the new ITR method has higher accuracy and is more time-efficient than recently proposed Statistical Trap-Response (STR) method, thus is helpful for trap-related research on both reliability and variability.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000343833200193&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Engineering, Electrical & Electronic; CPCI-S(ISTP); 0
语种	英语
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/292455]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Guo, Shaofeng,Ren, Pengpeng,Wang, Runsheng,et al. New Efficient Method for Characterizing Time Constants of Switching Oxide Traps. 2014-01-01.

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