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浏览/检索结果: 共7条，第1-7条 帮助 限定条件 发表日期：2018     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 The influence of materials on the breaching process of natural dams 期刊论文 LANDSLIDES, 2018, 卷号: 15, 期号: 2, 页码: 243-255 作者:  Jiang Xiangang;  Huang Jiahua;  Wei Yunwei;  Niu Zhipan;  Chen Fenghui 收藏  |  浏览/下载：46/0  |  提交时间：2018/02/22 Natural dams  Materials  Breaching process  Breach   Gate Leakage and Breakdown Characteristics of AlGaN/GaN High-Electron-Mobility Transistors with Fe Delta-Doped Buffer 期刊论文 NANOSCIENCE AND NANOTECHNOLOGY LETTERS, 2018, 卷号: 10, 期号: 2, 页码: 185-189 作者:  Meilan Hao ;   Quan Wang ;   Lijuan Jiang ;   Chun Feng ;   Changxi Chen ;   Cuimei Wang ;   Hongling Xiao ;   Fengqi Liu ;   Xiangang Xu ;   Xiaoliang Wang ;   Zhanguo Wang 收藏  |  浏览/下载：34/0  |  提交时间：2019/11/15 Experimental investigation of failure modes and breaching characteristics of natural dams 期刊论文 GEOMATICS NATURAL HAZARDS & RISK, 2018, 卷号: 9, 期号: 1, 页码: 33-48 作者:  Jiang, Xiangang;  Wei, Yunwei;  Wu, Lei;  Lei, Yu 收藏  |  浏览/下载：47/0  |  提交时间：2018/06/05 Natural dam  failure mode  breaching time   X-Band GaN High Electron Mobility Transistor Power Amplifier on 6H-SiC with 110 W Output Power 期刊论文 JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2018, 卷号: 18, 期号: 11, 页码: 7451-7454 作者:  Wang, Quan;  Wang, Xiaoliang;  Xiao, Hongling;  Wang, Cuimei;  Jiang, Lijuan 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/11 X-Band  GaN HEMT  Power Amplifier   Gate Leakage and Breakdown Characteristics of AlGaN/GaN High-Electron-Mobility Transistors with Fe Delta-Doped Buffer 期刊论文 NANOSCIENCE AND NANOTECHNOLOGY LETTERS, 2018, 卷号: 10, 期号: 2, 页码: 185-189 作者:  Hao, Meilan;  Wang, Quan;  Jiang, Lijuan;  Feng, Chun;  Chen, Changxi 收藏  |  浏览/下载：11/0  |  提交时间：2019/12/11 HEMT  Fe Doping  Gate Leakage  Breakdown  PF Emission  FN Tunneling   Trapping Effects Induced by Gate OFF-State Stress in AlGaN/GaN High-Electron-Mobility Transistors with Fe-Doped Buffer 期刊论文 JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2018, 卷号: 18, 期号: 11, 页码: 7479-7483 作者:  Hao, Meilan;  Wang, Quan;  Jiang, Lijuan;  Feng, Chun;  Chen, Changxi 收藏  |  浏览/下载：7/0  |  提交时间：2019/12/11 AlGaN/GaN HEMT  Pulsed I-V  Trapping  Gate OFF-State Stress  Fe-Doped  Buffer   Experimental investigation of failure modes and breaching characteristics of natural dams 期刊论文 GEOMATICS NATURAL HAZARDS & RISK, 2018, 卷号: 9, 期号: 1, 页码: 33-48 作者:  Jiang, Xiangang;  Wei, Yunwei;  Wu, Lei;  Lei, Yu 收藏  |  浏览/下载：47/0  |  提交时间：2018/06/05 Natural dam  failure mode  breaching time