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浏览/检索结果: 共7条，第1-7条 帮助 限定条件 发表日期：2018     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs With ON-State Bias Irradiation 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1503-1510 作者:  Yang, L (Yang, Ling)[ 1,2 ];  Zhang, QZ (Zhang, Qingzhu)[ 1,3 ];  Huang, YB (Huang, Yunbo)[ 1,2 ];  Zheng, ZS (Zheng, Zhongshan)[ 1,2 ];  Li, B (Li, Bo)[ 1,2 ] 收藏  |  浏览/下载：35/0  |  提交时间：2018/09/18 Anneal  Finfet  On-state Bias  Total Ionizing Dose (Tid)   Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor 期刊论文 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-10 作者:  Zhang, JX (Zhang, Jin-Xin)[ 1 ];  Guo, HX (Guo, Hong-Xia)[ 2,3 ];  Pan, XY (Pan, Xiao-Yu)[ 3 ];  Guo, Q (Guo, Qi)[ 2 ];  Zhang, FQ (Zhang, Feng-Qi)[ 3 ] 收藏  |  浏览/下载：38/0  |  提交时间：2018/11/20 Sige Hbt  Synergistic Effect  Single Event Effects  Total Ionizing Dose   Estimation of low-dose-rate degradation on bipolar linear circuits using different accelerated evaluation methods 期刊论文 ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 9, 页码: 202-209 作者:  Li, XL (Li Xiao-Long)[ 1,2,3 ];  Lu, W (Lu Wu)[ 1,2 ];  Wang, X (Wang Xin)[ 1,2,3 ];  Guo, Q (Guo Qi)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1,2 ] 收藏  |  浏览/下载：35/0  |  提交时间：2018/09/27 Bipolar Circuit  Enhanced Low-dose-rate Sensitivity  Accelerated Evaluation Method   Total ionizing dose effects in pinned photodiode complementary metal-oxide-semiconductor transistor active pixel sensor 期刊论文 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-5 作者:  Ma, LD (Ma, Lin-Dong)[ 1,2,3 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhang, X (Zhang, Xiang)[ 1,2,3 ] 收藏  |  浏览/下载：45/0  |  提交时间：2018/11/20 Cmos Active Pixel Sensor  Dark Current  Quantum Efficiency   Simulation of Synergism Effect Using Temperature Switching Irradiation on Bipolar Comparator 期刊论文 CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 8, 页码: 1-4 作者:  Yu, X (Yu, Xin)[ 1,2 ];  Lu, W (Lu, Wu)[ 1,2 ];  Yao, S (Yao, Shuai)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Sun, J (Sun, Jing)[ 1,2 ] 收藏  |  浏览/下载：52/0  |  提交时间：2018/10/19 Effects of proton irradiation on upright metamorphic GaInP/GaInAs/Ge triple junction solar cells 期刊论文 SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2018, 卷号: 185, 期号: 10, 页码: 36-44 作者:  Aierken, A (Aierken, A.)[ 1 ];  Fang, L (Fang, L.)[ 2 ];  Heini, M (Heini, M.)[ 1 ];  Zhang, QM (Zhang, Q. M.)[ 2 ];  Li, ZH (Li, Z. H.)[ 1,3 ] 收藏  |  浏览/下载：38/0  |  提交时间：2018/08/07 Upright Metamorphic  Solar Cell  Proton Irradiation  Degradation  Srim   The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1920-1927 作者:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Lu, W (Lu, Wu)[ 1 ];  Guo, HX (Guo, Hongxia)[ 1 ];  Liu, J (Liu, Jie)[ 2 ] 收藏  |  浏览/下载：53/0  |  提交时间：2018/09/27 Charge Sharing  Single-event Upset (Seu)  Static Random Access Memory  Total Ionizing Dose (Tid)