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浏览/检索结果: 共9条，第1-9条 帮助 限定条件 发表日期：2021     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Circulating tRNA-Derived Small RNAs as Novel Radiation Biomarkers of Heavy Ion, Proton and X-ray Exposure 期刊论文 INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES, 2021, 卷号: 22, 期号: 24, 页码: 15 作者:  Wei, Wenjun;  Bai, Hao;  Chen, Yaxiong;  Zhang, Tongshan;  Zhang, Yanan 收藏  |  浏览/下载：22/0  |  提交时间：2022/04/11 tsRNA  serum  biomarkers  radiation exposure  multi-factor models   3D Deep Learning Model for the Pretreatment Evaluation of Treatment Response in Esophageal Carcinoma: A Prospective Study (ChiCTR2000039279) 期刊论文 INTERNATIONAL JOURNAL OF RADIATION ONCOLOGY BIOLOGY PHYSICS, 2021, 卷号: 111, 期号: 4, 页码: 926-935 作者:  Li, Xiaoqin;  Gao, Han;  Zhu, Jian;  Huang, Yong;  Zhu, Yongbei 收藏  |  浏览/下载：41/0  |  提交时间：2021/12/28 Identification of novel biomarkers of heavy ion exposure: Proteins, miRNAs and tRNA-derived fragments in serum 期刊论文 ACTA ASTRONAUTICA, 2021, 卷号: 186, 页码: 329-336 作者:  Bai, Hao;  Zhang, Tongshan;  Wang, Jufang;  Hua, Junrui;  Wei, Wenjun 收藏  |  浏览/下载：142/0  |  提交时间：2021/12/09 Heavy ions  Serum  Biomarkers  Protein  miRNA  tRF&tiRNA   Experimental investigation on total-ionizing-dose radiation effects on the electrical properties of SOI-LIGBT 期刊论文 SOLID-STATE ELECTRONICS, 2021, 卷号: 175, 期号: 1, 页码: 1-7 作者:  Yang, GG (Yang, Guangan)[ 1 ];  Wu, WR (Wu, Wangran)[ 1 ];  Zhang, XY (Zhang, Xingyao)[ 2 ];  Tang, PY (Tang, Pengyu)[ 1 ];  Yang, J (Yang, Jing)[ 1 ] 收藏  |  浏览/下载：30/0  |  提交时间：2021/03/15 SOI-LIGBT  Total-ionizing-dose  Radiation  Degradation   Impact of TID on Within-Wafer Variability of Radiation-Hardened SOI Wafers 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 7, 页码: 1423-1429 作者:  Zheng, QW (Zheng, Qiwen) 1;  Cui, JW (Cui, Jiangwei) 1;  Yu, XF (Yu, Xuefeng) 1;  Li, YD (Li, Yudong) 1;  Lu, W (Lu, Wu) 1 收藏  |  浏览/下载：40/0  |  提交时间：2021/08/06 Radiation-hardened (RH)silicon-on-insulator (SOI)total ionizing dose (TID)within-wafer variability   Influence of enhanced low dose rate sensitivity on single-event transient degradation in the LM158 bipolar operational amplifier 期刊论文 AIP ADVANCES, 2021, 卷号: 11, 期号: 5, 页码: 1-6 作者:  Xiang, CAF (Xiang, Chuanfeng) 1 , 2;  Yao, S (Yao, Shuai) 1 , 3;  Lu, W (Lu, Wu) 1 , 2;  Li, XL (Li, Xiaolong) 1;  Yu, X (Yu, Xin) 1 收藏  |  浏览/下载：34/0  |  提交时间：2021/08/06 Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal 期刊论文 RADIATION PHYSICS AND CHEMISTRY, 2021, 卷号: 189, 期号: 12, 页码: 1-5 作者:  Li, YD (Li, Yudong);  Liu, BK (Liu, Bingkai);  Wen, L (Wen, Lin);  Wei, Y (Wei, Ying);  Zhou, D (Zhou, Dong) 收藏  |  浏览/下载：29/0  |  提交时间：2021/10/14 Radiation effectsTotal ionizing dose (TID)Charge coupled device (CCD)Dark signalOxide trapped charges   Radiation Effects and Mechanisms on Switching Characteristics of Silicon Carbide Power MOSFETs 期刊论文 JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2021, 卷号: 16, 期号: 9, 页码: 1423-1429 作者:  Feng, HN (Feng, Haonan) [1] , [2] , [3];  Yang, S (Yang, Sheng) [1] , [2] , [3];  Liang, XW (Liang, Xiaowen) [1] , [2] , [3];  Zhang, D (Zhang, Dan) [1] , [2] , [3];  Pu, XJ (Pu, Xiaojuan) [1] , [2] , [3] 收藏  |  浏览/下载：40/0  |  提交时间：2022/03/24 SiC Power MOSFETs  Switching Characteristics  Total Ionizing Dose (TID) Effect  Static Characteristic  Parasitic Capacitance   TID Response and Radiation-Enhanced Hot-Carrier Degradation in 65-nm nMOSFETs: Concerns on the Layout-Dependent Effects 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 8, 页码: 1565-1570 作者:  Ren, ZX (Ren, Zhexuan);  1An, X (An, Xia) 1;  Li, GS (Li, Gensong) 1;  Liu, JY (Liu, Jingyi) 1;  Xun, MZ (Xun, Mingzhu) 2 收藏  |  浏览/下载：34/0  |  提交时间：2021/09/22 65 nmhot-carrier injection (HCI)layout-dependent effect (LDE)nMOSstressthreshold voltagetotal ionizing dose (TID)