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Failure analysis and reliability evaluation of silver-sintered die attachment for high-temperature applications 期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 94, 页码: 46-55
作者:  Zhang, Hongqiang;  Zhao, Zhenyu;  Zou, Guisheng;  Wang, Wengan;  Liu, Lei
收藏  |  浏览/下载:56/0  |  提交时间:2019/12/30
Microstructural and mechanical evolution of silver sintering die attach for SiC power devices during high temperature applications 期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 卷号: 774, 页码: 487-494
作者:  Zhang, Hongqiang;  Wang, Wengan;  Bai, Hailin;  Zou, Guisheng;  Liu, Lei
收藏  |  浏览/下载:9/0  |  提交时间:2019/12/30


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