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Application and Significance of the Equivalent Circuit Method in the Analysis of Dielectric Response 期刊论文
2018, 卷号: 38, 页码: 300-308
作者:  Gao, Yanfeng[1];  Liang, Xidong[2];  Chalashkanov, N.M.[3];  Wu, Chao[2];  Zuo, Zhou[4]
收藏  |  浏览/下载:9/0  |  提交时间:2019/11/30
DC Breakdown voltage tests may not be a good indicator of long-Term ageing behaviour: A study of silica - XLPE nanocomposites 会议论文
作者:  Lei, Weiqun;  Dissado, L.A.;  Dodd, S.J.;  Chalashkanov, N.M.;  Fothergill, J.C.
收藏  |  浏览/下载:2/0  |  提交时间:2019/11/26


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