CORC

在结果中检索

CORC

浏览/检索结果: 共36条，第1-10条 帮助

限定条件                
已选(0)清除 条数/页：   排序方式：
Impact of TID on latch up induced by pulsed irradiation in CMOS circuits 期刊论文
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2019, 卷号: 440, 页码: 95-100
作者:  Li, Ruibin;  He, Chaohui;  Chen, Wei;  Li, Junlin;  Wang, Chenhui
收藏  |  浏览/下载：4/0  |  提交时间：2019/11/19
Corrosion Condition Detect of Entire Grounding System in a 500kV Converting Station Using Electrical Impedance Imaging Method 会议论文
作者:  He, Yifan;  Shao, Xianjun;  Hu, Jiayuan;  Liu, Yuanchen;  Jin, Chaohui
收藏  |  浏览/下载：4/0  |  提交时间：2019/11/19
Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam 期刊论文
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2018
作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua
收藏  |  浏览/下载：26/0  |  提交时间：2019/11/19
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error 期刊论文
Journal of Electronic Testing: Theory and Applications (JETTA), 2018, 卷号: 34, 页码: 717-733
作者:  Du, Xiaozhi;  Luo, Dongyang;  He, Chaohui;  Liu, Shuhuan
收藏  |  浏览/下载：9/0  |  提交时间：2019/11/19
Effects of photonic crystal structures on the imaging properties of a ZnO:Ga image converter 期刊论文
Optics Letters, 2018, 卷号: 43, 页码: 5647-5650
作者:  Xu, Mengxuan;  Chen, Liang;  Liu, Bo;  Zhu, Zhichao;  Huang, Feng
收藏  |  浏览/下载：10/0  |  提交时间：2019/11/19
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC 期刊论文
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2018, 卷号: 34, 页码: 15-25
作者:  Du, Xiaozhi;  Luo, Dongyang;  Shi, Kailun;  He, Chaohui;  Liu, Shuhuan
收藏  |  浏览/下载：2/0  |  提交时间：2019/11/26
Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation 会议论文
作者:  Liu, Shuhuan;  Du, Xuecheng;  Du, Xiaozhi;  Zhang, Yao;  Mubashiru, Lawal Olarewaju
收藏  |  浏览/下载：11/0  |  提交时间：2019/11/26
Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip 期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2017, 卷号: 54, 页码: 287-292
作者:  Du, Xuecheng;  He, Chaohui;  Liu, Shuhuan;  Zhang, Yao;  Li, Yonghong
收藏  |  浏览/下载：10/0  |  提交时间：2019/11/26
An Investigation of ELDRS in Different SiGe Processes 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 页码: 1137-1141
作者:  Li, Pei;  He, Chaohui;  Guo, Hongxia;  Guo, Qi;  Zhang, Jinxin
收藏  |  浏览/下载：3/0  |  提交时间：2019/11/26
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip 期刊论文
MICROELECTRONICS RELIABILITY, 2017, 卷号: 71, 页码: 65-70
作者:  Du, Xuecheng;  Liu, Shuhuan;  Luo, Dongyang;  Zhang, Yao;  Du, Xiaozhi
收藏  |  浏览/下载：6/0  |  提交时间：2019/11/26

©版权所有 ©2017 CSpace - Powered by CSpace