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	Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip
	Du, Xuecheng; He, Chaohui; Liu, Shuhuan; Zhang, Yao; Li, Yonghong; Yang, Weitao
刊名	JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY
	2017
卷号	54页码:287-292
关键词	System-on-chip alpha particle single event effects radiation effect
ISSN号	0022-3131
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2946183
专题	西安交通大学
推荐引用方式 GB/T 7714	Du, Xuecheng,He, Chaohui,Liu, Shuhuan,et al. Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip[J]. JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY,2017,54:287-292.
APA	Du, Xuecheng,He, Chaohui,Liu, Shuhuan,Zhang, Yao,Li, Yonghong,&Yang, Weitao.(2017).Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip.JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY,54,287-292.
MLA	Du, Xuecheng,et al."Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip".JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY 54(2017):287-292.

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