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浏览/检索结果: 共16条，第1-10条 帮助 限定条件 发表日期：2018     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文 Geneva, SWITZERLAND, OCT 02-06, 2017 作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie 收藏  |  浏览/下载：38/0  |  提交时间：2018/10/08 Charge sharing  single-event upset (SEU)  static random access memory  total ionizing dose (TID)   Influences of total ionizing dose on single event effect sensitivity in floating gate cells 期刊论文 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 8, 页码: 086103 作者:  Zhao, Pei-Xiong;  Liu, Tian-Qi;  Ye, Bing;  Luo, Jie;  Sun, You-Mei 收藏  |  浏览/下载：33/0  |  提交时间：2018/10/08 flash memories  heavy ions  synergistic effect  total ionizing dose   Assessment of mouse BMMNC DNA damage with a two-tailed comet assay after X-ray and carbon ion total body irradiation 期刊论文 NUCLEAR SCIENCE AND TECHNIQUES, 2018, 卷号: 29, 页码: 77 作者:  Wang, Zhuan-Zi;  Li, Wen-Jian;  Wei, Wei;  Dang, Bing-Rong;  Liu, Fang 收藏  |  浏览/下载：23/0  |  提交时间：2018/07/16 Two-tailed comet assay, carbon ion irradiation  X-ray irradiation  Bone marrow mononuclear cells  DNA damage   Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs With ON-State Bias Irradiation 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018 作者:  Yang L(杨玲);  Zhang QZ(张青竹);  Huang YB(黄云波);  Zheng ZS(郑中山);  Li B(李博) 收藏  |  浏览/下载：17/0  |  提交时间：2019/03/28 Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs With ON-State Bias Irradiation 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1503-1510 作者:  Yang, L (Yang, Ling)[ 1,2 ];  Zhang, QZ (Zhang, Qingzhu)[ 1,3 ];  Huang, YB (Huang, Yunbo)[ 1,2 ];  Zheng, ZS (Zheng, Zhongshan)[ 1,2 ];  Li, B (Li, Bo)[ 1,2 ] 收藏  |  浏览/下载：34/0  |  提交时间：2018/09/18 Anneal  Finfet  On-state Bias  Total Ionizing Dose (Tid)   Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor 期刊论文 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-10 作者:  Zhang, JX (Zhang, Jin-Xin)[ 1 ];  Guo, HX (Guo, Hong-Xia)[ 2,3 ];  Pan, XY (Pan, Xiao-Yu)[ 3 ];  Guo, Q (Guo, Qi)[ 2 ];  Zhang, FQ (Zhang, Feng-Qi)[ 3 ] 收藏  |  浏览/下载：38/0  |  提交时间：2018/11/20 Sige Hbt  Synergistic Effect  Single Event Effects  Total Ionizing Dose   Estimation of low-dose-rate degradation on bipolar linear circuits using different accelerated evaluation methods 期刊论文 ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 9, 页码: 202-209 作者:  Li, XL (Li Xiao-Long)[ 1,2,3 ];  Lu, W (Lu Wu)[ 1,2 ];  Wang, X (Wang Xin)[ 1,2,3 ];  Guo, Q (Guo Qi)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1,2 ] 收藏  |  浏览/下载：35/0  |  提交时间：2018/09/27 Bipolar Circuit  Enhanced Low-dose-rate Sensitivity  Accelerated Evaluation Method   Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs 期刊论文 CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 4, 页码: 1-4 作者:  Zheng, QW (Zheng, Qi-Wen);  Cui, JW (Cui, Jiang-Wei);  Wei, Y (Wei, Ying);  Yu, XF (Yu, Xue-Feng);  Lu, W (Lu, Wu) 收藏  |  浏览/下载：33/0  |  提交时间：2018/05/07 Total ionizing dose and synergistic effects of magnetoresistive random-access memory 期刊论文 NUCLEAR SCIENCE AND TECHNIQUES, 2018, 卷号: 29, 期号: 8, 页码: 1-5 作者:  Zhang, XY (Zhang, Xing-Yao);  Guo, Q (Guo, Qi);  Li, YD (Li, Yu-Dong);  Wen, L (Wen, Lin);  Zhang, XY 收藏  |  浏览/下载：17/0  |  提交时间：2018/08/07 Magnetoresistive Random-access Memory Total Ionizing Dose  Synergistic Effect   Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor 期刊论文 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 3, 页码: 1-9 作者:  Li, XL (Li, Xiao-Long);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Yu, X (Yu, Xin);  Guo, Q (Guo, Qi) 收藏  |  浏览/下载：22/0  |  提交时间：2018/05/14 Ionizing Radiation Damage  Enhanced Low Dose Rate Sensitivity (Eldrs)  Switched Temperature Irradiation  Gate-controlled Lateral Pnp Transistor (glPnp)