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浏览/检索结果: 共10条，第1-10条 帮助 限定条件 专题：西安交通大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam 期刊论文 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2018 作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua 收藏  |  浏览/下载：26/0  |  提交时间：2019/11/19 All Programmable SoC  Heavy ion microbeam  Layout information  Modern physics  On chip memory  Partial cross section  Single event effects  System on chips (SoC)   Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 545-549 作者:  Yang, Weitao;  Du, Xuecheng;  He, Chaohui;  Shi, Shuting;  Cai, Li 收藏  |  浏览/下载：10/0  |  提交时间：2019/11/26 microbeam  single-event effect (SEE)  processing system (PS)  Heavy ion  system on chip (SoC)   On-Orbit Single Event Effect of the Digital Signal Processor of the Alpha Magnetic Spectrometer and Discrepancy Analysis for the Rate Prediction 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 1140-1146 作者:  Fan, Yun Yun;  Cai, Xu Dong;  He, Chao Hui;  Liu, Dong 收藏  |  浏览/下载：11/0  |  提交时间：2019/11/26 single event upset (SEU)  single event function interrupt (SEFI)  prediction  DSP  International Space Station (ISS)   SINGLE EVENT EFFECT CHARACTERISTICS ANALYSIS OF TYPICAL CIRCUIT ELEMENTS IN SPACECRAFT POWER SYSTEMS 会议论文 作者:  Zhao Wen;  He Chaohui;  Chen Wei;  Guo Xiaoqiang;  Cong Peitian 收藏  |  浏览/下载：10/0  |  提交时间：2019/11/26 mitigation approaches  single event effect  single event burnout  single event transients   Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip 期刊论文 JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2017, 卷号: 54, 页码: 287-292 作者:  Du, Xuecheng;  He, Chaohui;  Liu, Shuhuan;  Zhang, Yao;  Li, Yonghong 收藏  |  浏览/下载：10/0  |  提交时间：2019/11/26 System-on-chip  alpha particle  single event effects  radiation effect   Temporal characteristic analysis of single event effects in pulse width modulator 期刊论文 NUCLEAR SCIENCE AND TECHNIQUES, 2017, 卷号: 28 作者:  Zhao, Wen;  Guo, Xiao-Qiang;  Chen, Wei;  Wang, Zu-Jun;  Guo, Hong-Xia 收藏  |  浏览/下载：3/0  |  提交时间：2019/11/26 Single event effect (SEE)  Laser testing  Pulse width modulator   Primary single event effect studies on Xilinx 28-nm System-on-Chip (SoC) 会议论文 作者:  Zhang, Yao;  Liu, Shuhuan;  Du, Xuecheng;  Yuan, Yuan;  He, Chaohui 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/02 System-on-Chip  Irradiation experiments  Single event effect  Simulation   Simulation and sesign of single event effect radiation hardening for SiGe heterojunction bipolar transistor 期刊论文 ACTA PHYSICA SINICA, 2015, 卷号: 64, 期号: [db:dc_citation_issue] 作者:  Li Pei;  Guo Hong-Xia;  Guo Qi;  Wen Lin;  Cui Jiang-Wei 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/02 hardening design  SiGe heterojunction bipolar transistor  single event effect  dummy collector   Single-event response of the SiGe HBT in TCAD simulations and laser microbeam experiment 期刊论文 CHINESE PHYSICS B, 2015, 卷号: 24, 期号: [db:dc_citation_issue] 作者:  Li Pei;  Guo Hong-Xia;  Guo Qi;  Zhang Jin-Xin;  Xiao Yao 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/02 laser microbeam experiment  SiGe heterojunction bipolar transistor  single event effect  three-dimensional numerical simulation   Three-dimensional simulation study of bias effect on single event effects of SiGe heterojunction bipolar transistor 期刊论文 ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: [db:dc_citation_issue] 作者:  Zhang Jin-Xin;  He Chao-Hui;  Guo Hong-Xia;  Tang Du;  Xiong Cen 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/03 different bias  SiGe heterojunction bipolar transistor  single event effect  3D numerical simulation