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华南理工大学 [18]
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会议 [18]
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Software Defect Prediction based on Conditional Random Field in Imbalance Distribution (CPCI-S收录)
会议
作者:
Yang, Chunhui[1,2]
;
Gao, Yan[2,3]
;
Xiang, Jianwen[1]
;
Liang, Lixin[4]
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/04/11
Software defect prediction
imbalance distribution
conditional random field
meanshift clustering method
An Improved Fast Self-Comparison Algorithm for High-Speed Defect Detection of ITO Circuits (CPCI-S收录)
会议
作者:
Jiang Changcheng[1]
;
Quan Yanming[1]
;
Lin Xingui[1]
;
Xing Zehui[1]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/11
defect detection
self-comparison algorithm
ITO circuit
Digital image processing
Software defect prediction based on manifold learning in subspace selection (EI收录)
会议
Wuhan, China,
作者:
Gao, Yan[1,2]
;
Yang, Chunhui[1,3]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/11
Defects
Discriminant analysis
Forecasting
Image retrieval
Learning algorithms
Learning systems
Principal component analysis
Support vector machines
Vectors
Aging Mathematical Model of InGaN/GaN LEDs based on Non-radiative Recombination (CPCI-S收录)
会议
作者:
Xu, Linwang[1]
;
Qian, Keyuan[1]
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/11
Light emitting diode (LED)
Arrhenius model
Non-radiative recombination defect
Aging model
Accelerated life test
Method and Evaluation of Repairing the Erosion Defect on the LSR Shed of the Insulation Jacket (CPCI-S收录)
会议
作者:
Ye, Weian[1]
;
Jia, Zhidong[1]
;
Chen, Can[1]
;
Liu, Shitao[2]
;
Yan, Zhenhua[2]
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/11
LSR insulation jacket
erosion
repairing method
property evaluation
An improved fast self-comparison algorithm for high-speed defect detection of ITO Circuits (EI收录)
会议
Macau, China,
作者:
Jiang, Changcheng[1]
;
Quan, Yanming[1]
;
Lin, Xingui[1]
;
Xing, Zehui[1]
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/11
Algorithms
Defects
Fast Fourier transforms
Image processing
Reconfigurable hardware
Template matching
Probabilistic failure assessment of a complex nozzle structure with flaw defect based on FITNET procedure (EI收录)
会议
Vancouver, BC, Canada,
作者:
Wang, Yan[1]
;
Wang, Yan-Wei[1]
;
Chen, Hanxin[1]
;
Ma, Linwei[1]
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/04/11
Cracks
Defects
Failure (mechanical)
Finite element method
Fracture mechanics
Intelligent systems
Monte Carlo methods
Nozzles
Pressure vessels
Probability
Safety engineering
A Defect Detection Method based on Sub-image Statistical Feature for Texture Surface (CPCI-S收录)
会议
作者:
Wu, Xiaojun[1,2]
;
Xiong, Huijiang[1]
;
Wen, Peizhi[3]
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/11
Defect detection
texture surface
gray level difference of sub-image
statistical feature
Dynamic wetting behavior and solder ball spattering formation of Sn-Bi solder pastes during reflow soldering process (CPCI-S收录)
会议
作者:
Tan, Meng-Ying
;
Zhou, Min-Bo
;
Huang, Lia-Qiang
;
Ma, Fa-Qian
;
Ma, Xiao
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/11
surface defect
solder ball spattering
Sn-Bi solder paste
reflow soldering process
Pseudo-samples generation in Gaussian mixture distribution for software defect prediction (EI收录)
会议
Wuhan, China,
作者:
Gao, Yan[1,2]
;
Yang, Chunhui[1,3]
;
Liang, Lixin[4]
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/11
Defects
Forecasting
Gaussian distribution
Random processes
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