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Investigation of optical and material properties of Si/SiGe/Si heterostructures by using spectroscopic ellipsometry and a variety of characterizations 会议论文
osa topical conference:the 4th advances in optoelectronics and micro/nano-optics, xi’an, china, 2014-09
作者:  Deng Xie;  Zhi Ren Qiu;  Ting Mei;  Chee Wee Liu;  Zhe Chuan Feng
收藏  |  浏览/下载:12/0  |  提交时间:2015/05/22


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