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CORC

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Comparison of holes trapping and protons transport induced by low dose rate gamma radiation in oxide on different SiGe processes 期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 103, 期号: 12, 页码: 1-5
作者:  Li, P (Li, Pei)[ 1 ];  He, CH (He, ChaoHui)[ 1 ];  Guo, HX (Guo, HongXia)[ 2,3 ];  Zhang, JX (Zhang, JinXin)[ 4 ];  Li, YH (Li, YongHong)[ 1 ]
收藏  |  浏览/下载：34/0  |  提交时间：2020/01/10
Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-10
作者:  Zhang, JX (Zhang, Jin-Xin)[ 1 ];  Guo, HX (Guo, Hong-Xia)[ 2,3 ];  Pan, XY (Pan, Xiao-Yu)[ 3 ];  Guo, Q (Guo, Qi)[ 2 ];  Zhang, FQ (Zhang, Feng-Qi)[ 3 ]
收藏  |  浏览/下载：38/0  |  提交时间：2018/11/20
Investigation of enhanced low dose rate sensitivity in SiGe HBTs by Co-60 gamma irradiation under different biases 期刊论文
MICROELECTRONICS RELIABILITY, 2018, 卷号: 84, 期号: 5, 页码: 105-111
作者:  Zhang, JX (Zhang, Jin-xin);  Guo, Q (Guo, Qi);  Guo, HX (Guo, Hong-xia);  Lu, W (Lu, Wu);  He, CH (He, Chao-hui)
收藏  |  浏览/下载：37/0  |  提交时间：2018/06/20
Total Ionizing Dose Effects of SiGe HBTs Induced by Co-60 Gamma-Ray Irradiation 期刊论文
NUCLEAR SCIENCE AND ENGINEERING, 2018, 卷号: 191, 页码: 98-103
作者:  Liu, Shu-Huan;  Hussain, Aqil;  Li, Da;  Guo, Xiaoqiang;  Li, Zhuo-Qi
收藏  |  浏览/下载：5/0  |  提交时间：2019/11/19
Investigation of enhanced low dose rate sensitivity in SiGe HBTs by Co-60 gamma irradiation under different biases 期刊论文
MICROELECTRONICS RELIABILITY, 2018, 卷号: 84, 页码: 105-111
作者:  Zhang, Jin-xin;  Guo, Qi;  Guo, Hong-xia;  Lu, Wu;  He, Chao-hui
收藏  |  浏览/下载：13/0  |  提交时间：2019/11/26
An Investigation of ELDRS in Different SiGe Processes 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 期号: 5, 页码: 1137-1141
作者:  Li, P (Li, Pei);  He, CH (He, Chaohui);  Guo, HX (Guo, Hongxia);  Guo, Q (Guo, Qi);  Zhang, JX (Zhang, Jinxin)
收藏  |  浏览/下载：32/0  |  提交时间：2017/06/20
An investigation of ionizing radiation damage in different SiGe processes 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 8
作者:  Li, P (Li, Pei);  Liu, MH (Liu, Mo-Han);  He, CH (He, Chao-Hui);  Guo, HX (Guo, Hong-Xia);  Zhang, JX (Zhang, Jin-Xin)
收藏  |  浏览/下载：16/0  |  提交时间：2017/12/11
Comparison of total dose effects on SiGe heterojunction bipolar transistors induced by different swift heavy ion irradiation 期刊论文
2016, 2016
孙亚宾; 付军; 许军; 王玉东; 周卫; 张伟; 崔杰; 李高庆; 刘志弘; Sun Ya-Bin; Fu Jun; Xu Jun; Wang Yu-Dong; Zhou Wei; Zhang Wei; Cui Jie; Li Gao-Qing; Liu Zhi-Hong
收藏  |  浏览/下载：4/0
SiGe HBT~(60) Co γ辐照总剂量效应 期刊论文
2016, 2016
刘书焕; 李达; 郭晓强; 林东升; 张伟; 刘新赞; Liu Shuhuan; Li Da; Guo Xiaoqiang; Lin Dongsheng; Zhang Wei; Liu Xinzan
收藏  |  浏览/下载：4/0
Total ionizing dose effects of domestic SiGe HBTs under different dose rates 期刊论文
CHINESE PHYSICS C, 2016, 卷号: 40, 期号: 3
作者:  Liu, MH (Liu, Mo-Han);  Lu, W (Lu, Wu);  Ma, WY (Ma, Wu-Ying);  Wang, X (Wang, Xin);  Guo, Q (Guo, Qi)
收藏  |  浏览/下载：23/0  |  提交时间：2016/12/12

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