CORC

浏览/检索结果: 共2条,第1-2条 帮助

已选(0)清除 条数/页:   排序方式:
Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs 期刊论文
CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 4, 页码: 1-4
作者:  Zheng, QW (Zheng, Qi-Wen);  Cui, JW (Cui, Jiang-Wei);  Wei, Y (Wei, Ying);  Yu, XF (Yu, Xue-Feng);  Lu, W (Lu, Wu)
收藏  |  浏览/下载:33/0  |  提交时间:2018/05/07
Total ionizing dose effect on 0.18 mu m narrow-channel NMOS transistors 期刊论文
ACTA PHYSICA SINICA, 2013, 卷号: 62, 期号: 13
作者:  Wu Xue;  Lu Wu;  Wang Xin;  Xi Shan-Bin;  Guo Qi
收藏  |  浏览/下载:23/0  |  提交时间:2013/11/07


©版权所有 ©2017 CSpace - Powered by CSpace