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| Investigation of interface traps at Si/SiO2 interface of SOI pMOSFETs induced by Fowler–Nordheim tunneling stress using the DCIV method 期刊论文 Applied Physics A, 2018 作者: Wang RH(王瑞恒); Ceng CB(曾传滨); Li XJ(李晓静); Han ZS(韩郑生); Luo JJ(罗家俊) 收藏  |  浏览/下载:13/0  |  提交时间:2019/03/27 |
| DCIV 技术提取辐照前后 PDSOI 器件背栅界面态密度 期刊论文 微电子学与计算机, 2018 作者: 李晓静; 韩郑生; 罗家俊; 高林春; 曾传滨 收藏  |  浏览/下载:23/0  |  提交时间:2019/03/29 |
| Self-heating Enhanced HCI Degradation in pLDMOSFETs 其他 2015-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
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| Understanding of HCI degradation temperature dependence in SOI STI-pLDMOSFETs from MR-DCIV spectroscopy 其他 2015-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03 |
| Understanding of HCI Degradation Temperature Dependence in SOI STI-pLDMOSFETs from MR-DCIV Spectroscopy 其他 2015-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xin 收藏  |  浏览/下载:6/0  |  提交时间:2017/12/03
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| NBTI degradation in STI-based LDMOSFETs 其他 2014-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载:7/0  |  提交时间:2015/11/10
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| High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 期刊论文 日本应用物理学杂志, 2014 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10
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| SOI高压器件热载流子退化研究 期刊论文 北京大学学报 自然科学版, 2014 韩临; 何燕冬; 张钢刚 收藏  |  浏览/下载:7/0  |  提交时间:2015/11/11
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| High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他 2014-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03 |
| Understanding the Correlation of HCI and NBTI Degradation in pLDMOSFETs from MR-DCIV Technique 其他 2014-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载:11/0  |  提交时间:2015/11/13
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