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AlGaN Channel HEMT With Extremely High Breakdown Voltage 期刊论文
Electron Devices, IEEE Transactions on, 2013, 卷号: Vol.60 No.3, 页码: 1046-1053
作者:  Nanjo,T.;  Suita,M.;  Imai,A.;  Oishi,T.;  Suzuki,Y.
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