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Study of gamma-ray irradiation influence on TiN/HfO2/Si MOS capacitor by C-V and DLTS 期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2018, 卷号: Vol.120, 页码: 313-318
作者:  Li, Yun;  Ma, Yao;  Lin, Wei;  Dong, Peng;  Yang, Zhimei
收藏  |  浏览/下载:7/0  |  提交时间:2019/12/26
The Si Nanocrystal Trap Center Studied by Deep Level Transient Spectroscopy (DLTS) 期刊论文
Journal of Nanomaterials, 2014, 卷号: Vol.2014
作者:  Lv, TZ;  Zhao, LL
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/31


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