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2D electron density profile measurement in tokamak by laser-accelerated ion-beam probe 期刊论文
REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 卷号: 85, 期号: 11
Chen, YH; Yang, XY; Lin, C; Wang, L; Xu, M; Wang, XG; Xiao, CJ
收藏  |  浏览/下载:18/0  |  提交时间:2015/04/14
Quantum metrological bounds for vector parameters 期刊论文
PHYSICAL REVIEW A, 2014, 卷号: 90, 期号: 4
Zhang, YR; Fan, H
收藏  |  浏览/下载:16/0  |  提交时间:2015/04/14
Residual stress measurement in thin films using a slitting method with geometric phase analysis under a dual beam (FIB/SEM) system 期刊论文
MEASUREMENT SCIENCE & TECHNOLOGY, 2014, 卷号: 25, 期号: 9
Zhu, RH; Xie, HM; Dai, XL; Zhu, JG; Jin, AZ
收藏  |  浏览/下载:24/0  |  提交时间:2015/04/14
Phonons in two-dimensional soft colloidal crystals 期刊论文
PHYSICAL REVIEW E, 2013, 卷号: 88, 期号: 2
Chen, K; Still, T; Schoenholz, S; Aptowicz, KB; Schindler, M; Maggs, AC; Liu, AJ; Yodh, AG
收藏  |  浏览/下载:14/0  |  提交时间:2014/01/16
Unbounded quantum Fisher information in two-path interferometry with finite photon number 期刊论文
JOURNAL OF PHYSICS A-MATHEMATICAL AND THEORETICAL, 2013, 卷号: 46, 期号: 3
Zhang, YR; Jin, GR; Cao, JP; Liu, WM; Fan, H
收藏  |  浏览/下载:14/0  |  提交时间:2014/01/17
In-plane and out-of-plane plasma resonances in optimally doped La1.84Sr0.16CuO4 期刊论文
SOLID STATE COMMUNICATIONS, 2013, 卷号: 156, 页码: 85
Kim, YH; Hor, PH; Dong, XL; Zhou, F; Zhao, ZX
收藏  |  浏览/下载:15/0  |  提交时间:2014/01/16
Spatial distribution of carrier-envelope phase for femtosecond pulsed laser beam profile determined by asymmetric spectral interferometry 期刊论文
OPTICS LETTERS, 2010, 卷号: 35, 期号: 13, 页码: 2275
Yu, ZH; Weng, YX
收藏  |  浏览/下载:17/0  |  提交时间:2013/09/24
A 350MHz Ti:sapphire laser comb based on monolithic scheme and absolute frequency measurement of 729nm laser 期刊论文
OPTICS EXPRESS, 2009, 卷号: 17, 期号: 8, 页码: 6059
Zhang, W; Han, HN; Zhao, YY; Du, Q; Wei, ZY
收藏  |  浏览/下载:21/0  |  提交时间:2013/09/17
Carrier-envelope phase measurement and stabilization of amplified Ti:sapphire femtosecond laser pulses by spectral interferometry 期刊论文
ACTA PHYSICA SINICA, 2008, 卷号: 57, 期号: 12, 页码: 7753
Zhu, JF; Du, Q; Wang, XL; Teng, H; Han, HN; Wei, ZY; Hun, X
收藏  |  浏览/下载:11/0  |  提交时间:2013/09/17
Measurement of specimen thickness by using electron holography and electron dynamic calculation with a transmission electron microscope 期刊论文
CHINESE PHYSICS LETTERS, 2003, 卷号: 20, 期号: 3, 页码: 389
Wang, YG; Liu, HR; Yang, QB; Zhang, Z
收藏  |  浏览/下载:12/0  |  提交时间:2013/09/18


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