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科研机构
半导体研究所 [16]
内容类型
期刊论文 [15]
会议论文 [1]
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2014 [1]
2011 [1]
2010 [6]
2009 [2]
2006 [3]
2005 [2]
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光电子学 [16]
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The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN
期刊论文
journal of applied physics, 2014, 卷号: 116, 期号: 16, 页码: 163708
Li, X. J.
;
Zhao, D. G.
;
Jiang, D. S.
;
Liu, Z. S.
;
Chen, P.
;
Zhu, J. J.
;
Le, L. C.
;
Yang, J.
;
He, X. G.
;
Zhang, S. M.
;
Zhang, B. S.
;
Liu, J. P.
;
Yang, H.
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2015/03/19
A new method to measure the carrier concentration of p-GaN
期刊论文
acta physica sinica, 2011, 卷号: 60, 期号: 3, 页码: article no.37804
Zhou M
;
Zhao DG
收藏
  |  
浏览/下载:66/7
  |  
提交时间:2011/07/05
p-GaN
carrier concentration measurement
ultraviolet photodetector
LASER-DIODES
FILMS
Fabrication of Silicon-Based Template-Assisted Nanoelectrode Arrays and Ohmic Contact Properties Investigation
期刊论文
journal of nanoscience and nanotechnology, 2010, 卷号: 10, 期号: 11 sp. iss. si, 页码: 7428-7431
Bai AQ (Bai Anqi)
;
Cheng BW (Cheng Buwen)
;
Wang XF (Wang Xiaofeng)
;
Xue CL (Xue Chunlai)
;
Zuo YH (Zuo Yuhua)
;
Wang QM (Wang Qiming)
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2010/11/30
ANODIC ALUMINA FILMS
NANOWIRE ARRAYS
POROUS ALUMINA
NANOCRYSTALS
Influence of AlN buffer layer thickness on structural properties of GaN epilayer grown on Si (111) substrate with AlGaN interlayer
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 3, 页码: art. no. 036801
Wu YX (Wu Yu-Xin)
;
Zhu JJ (Zhu Jian-Jun)
;
Chen GF (Chen Gui-Feng)
;
Zhang SM (Zhang Shu-Ming)
;
Jiang DS (Jiang De-Sheng)
;
Liu ZS (Liu Zong-Shun)
;
Zhao DG (Zhao De-Gang)
;
Wang H (Wang Hui)
;
Wang YT (Wang Yu-Tian)
;
Yang H (Yang Hui)
收藏
  |  
浏览/下载:127/4
  |  
提交时间:2010/04/13
GaN
Si (111) substrate
metalorganic chemical vapour deposition
AlN buffer layer
AlGaN interlayer
: VAPOR-PHASE EPITAXY
CRACK-FREE GAN
STRESS-CONTROL
SI(111)
DEPOSITION
ALXGA1-XN
FILM
Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 10, 页码: art. no. 106802
Guo X (Guo Xi)
;
Wang H (Wang Hui)
;
Jiang DS (Jiang De-Sheng)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Zhu JJ (Zhu Jian-Jun)
;
Liu ZS (Liu Zong-Shun)
;
Zhang SM (Zhang Shu-Ming)
;
Yang H (Yang Hui)
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  |  
浏览/下载:28/0
  |  
提交时间:2010/11/02
InGaN
In-plane grazing incidence x-ray diffraction
reciprocal space mapping
biaxial strain
CRITICAL LAYER THICKNESS
OPTICAL-PROPERTIES
LATTICE-CONSTANTS
GAN
HETEROSTRUCTURES
ALLOYS
WELLS
Investigation on the strain relaxation of InGaN layer and its effects on the InGaN structural and optical properties
期刊论文
physica b-condensed matter, 2010, 卷号: 405, 期号: 22, 页码: 4668-4672
Wang H (Wang H.)
;
Jiang DS (Jiang D. S.)
;
Jahn U (Jahn U.)
;
Zhu JJ (Zhu J. J.)
;
Zhao DG (Zhao D. G.)
;
Liu ZS (Liu Z. S.)
;
Zhang SM (Zhang S. M.)
;
Qiu YX (Qiu Y. X.)
;
Yang H (Yang H.)
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2010/12/12
InGaN
Dislocation
Metalorganic chemical vapor deposition
High resolution X-ray diffraction
Cathodoluminescence
MISFIT DISLOCATIONS
QUANTUM-WELLS
BAND-GAP
EPILAYERS
GENERATION
ALLOYS
INN
Effects of AlGaN/AlN Stacked Interlayers on GaN Growth on Si (111)
期刊论文
chinese physics letters, 2010, 卷号: 27, 期号: 3, 页码: art. no. 038103
Wang H (Wang Hui)
;
Liang H (Liang Hu)
;
Wang Y (Wang Yong)
;
Ng KW (Ng Kar-Wei)
;
Deng DM (Deng Dong-Mei)
;
Lau KM (Lau Kei-May)
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  |  
浏览/下载:96/3
  |  
提交时间:2010/04/22
VAPOR-PHASE EPITAXY
TEMPERATURE ALN INTERLAYERS
CRACK-FREE GAN
STRESS-CONTROL
SI(111)
DEPOSITION
REDUCTION
THICKNESS
NITRIDE
LAYERS
An experimental study about the influence of well thickness on the electroluminescence of InGaN/GaN multiple quantum wells
期刊论文
journal of alloys and compounds, 2010, 卷号: 489, 期号: 2, 页码: 461-464
作者:
Wang YT
;
Zhao DG
;
Zhang SM
;
Yang H
;
Jiang DS
收藏
  |  
浏览/下载:146/11
  |  
提交时间:2010/04/04
Nitride materials
Crystal growth
X-ray diffraction
TIME-RESOLVED PHOTOLUMINESCENCE
LIGHT-EMITTING-DIODES
PIEZOELECTRIC FIELDS
LASER-DIODES
DEPENDENCE
RECOMBINATION
POLARIZATION
DYNAMICS
GROWTH
MOCVD
Thickness dependent dislocation, electrical and optical properties in InN films grown by MOCVD
期刊论文
acta physica sinica, 2009, 卷号: 58, 期号: 5, 页码: 3416-3420
作者:
Li Y
;
Chen P
;
Jiang DS
;
Wang H
;
Wang ZG
收藏
  |  
浏览/下载:49/4
  |  
提交时间:2010/03/08
InN
dislocation
carrier origination
localization
Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction
期刊论文
semiconductor science and technology, 2009, 卷号: 24, 期号: 12, 页码: art.no.125007
Liu, JQ (Liu, J. Q.)
;
Wang, JF (Wang, J. F.)
;
Qiu, YX (Qiu, Y. X.)
;
Guo, X (Guo, X.)
;
Huang, K (Huang, K.)
;
Zhang, YM (Zhang, Y. M.)
;
Hu, XJ (Hu, X. J.)
;
Xu, Y (Xu, Y.)
;
Xu, K (Xu, K.)
;
Huang, XH (Huang, X. H.)
;
Yang, H (Yang, H.)
收藏
  |  
浏览/下载:244/114
  |  
提交时间:2010/03/08
THIN-FILMS
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