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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2016     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Fast Formation of Silicon Nanopore Array by Low-Dose Focused Ion Beam Raster Scanning Guided Anodization 期刊论文 JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016, 卷号: 16, 页码: 9930-9935 作者:  Wang, Minchang[1];  Ge, Daohan[2];  Wang, Jingjie[3];  Qin, Song[4];  Jiao, Jiwei[5] 收藏  |  浏览/下载：9/0  |  提交时间：2019/04/26 Nanopore Array  Anodic Etching  Focused Ion Beam  Raster Scanning   Performance Characteristics and Preliminary Analysis of Low Cost Tubular Linear Switch Reluctance Generator for Direct Drive WEC 期刊论文 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2016, 卷号: 26, 期号: 7 作者:  Wang, Daohan;  Shao, Chunlei;  Wang, Xiuhe;  Zhang, Chenghui 收藏  |  浏览/下载：7/0  |  提交时间：2019/12/16 dynamic analysis  high power density  linear generator  Marine wave  energy  switch reluctance machine   Design and Performance Evaluation of a Tubular Linear Switched Reluctance Generator with Low Cost and High Thrust Density 期刊论文 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2016, 卷号: 26, 期号: 7 作者:  Wang, Daohan;  Shao, Chunlei;  Wang, Xiuhe 收藏  |  浏览/下载：3/0  |  提交时间：2019/12/16 High power density  low cost  machine design  switch reluctance  generator  performance comparison   Performance Analysis and Design Optimization of an Annular Winding Bilateral Linear Switch Reluctance Machine for Low Cost Linear Applications 期刊论文 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2016, 卷号: 26, 期号: 7 作者:  Wang, Daohan;  Shao, Chunlei;  Wang, Xiuhe 收藏  |  浏览/下载：3/0  |  提交时间：2019/12/16 Annular winding  dual stator  dynamic analysis  high thrust density  linear switch reluctance machine   Fast Formation of Silicon Nanopore Array by Low-Dose Focused Ion Beam Raster Scanning Guided Anodization 期刊论文 JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016, 卷号: 16, 期号: 9, 页码: 9930-9935 作者:  Wang, Minchang[1];  Ge, Daohan[2];  Wang, Jingjie[3];  Qin, Song[4];  Jiao, Jiwei[5] 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/24 Nanopore Array  Anodic Etching  Focused Ion Beam  Raster Scanning