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A novel test data compression approach based on bit reversion
期刊论文
IEICE ELECTRONICS EXPRESS, 2017, 卷号: Vol.14 No.13
作者:
Cai, S
;
Zhou, YB
;
Liu, P
;
Yu, F
;
Wang, W
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  |  
浏览/下载:3/0
  |  
提交时间:2019/12/31
test data compression
code
bit reversion
A NEW DFT ARCHITECTURE TO REDUCE TEST DATA VOLUME AND TEST APPLICATION TIME
期刊论文
ENGINEERING REVIEW, 2016, 卷号: Vol.36 No.3, 页码: 197-202
作者:
Ling, Zhang
;
Jishun, Kuang
;
Junjin, Mei
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  |  
浏览/下载:7/0
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提交时间:2019/12/31
Test
data
compression
Integrated
circuits
Broadcast
architecture
Design
for
test
A scan disabling-based BAST scheme for test cost and test power reduction
期刊论文
IEICE ELECTRONICS EXPRESS, 2012, 卷号: Vol.9 No.2, 页码: 111-116
作者:
You, Zhiqiang
;
Wang, Weizheng
;
Liu, Peng
;
Kuang, Jishun
;
Qin, Zheng
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  |  
浏览/下载:3/0
  |  
提交时间:2020/01/05
design for testability (DFT)
test data volume compression
test power reduction
scan chain disabling
Efficient rate control technique for CCSDS image encoding (EI CONFERENCE)
会议论文
IEEE 2nd International Conference on Computing, Control and Industrial Engineering, CCIE 2011, August 20, 2011 - August 21, 2011, Wuhan, China
Jin L.
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浏览/下载:86/0
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提交时间:2013/03/25
For the limitation of data transmission bandwidth and real time transmission demand
generally image compression is required to implement the precise and flexible rate control algorithm. Rate control is an important issue in the image compression field. This paper considers the problem of rate allocation to each encoded segment for CCSDS image compression. One straightforward method is to allocate an equal amount of rate to each segment based on the average of the total number of compressed bytes. The obvious drawback of this method is that different segment will be reconstructed to different quality
so the overall quality of the reconstructed image will not be optimized. For the shortage of the original rate control method
as to improve the overall quality of the reconstructed image
an improved rate control algorithm is proposed for CCSDS image encoding. The key component of the proposed rate control method is the appropriate rate allocation. Experiments on the test images show that the PSNR can be increased at about 0.3dB on average
compared to the original algorithm. Therefore
experimental results confirm the effectiveness of the proposed algorithm in terms of objective evaluation
and the rate-distortion performance of the reconstructed image is improved. 2011 IEEE.
A scan disabling-based BAST scheme for test cost reduction
期刊论文
IEICE ELECTRONICS EXPRESS, 2011, 卷号: Vol.8 No.16, 页码: 1367-1373
作者:
You, ZQ
;
Wang, WZ
;
Dou, ZP
;
Liu, P
;
Kuang, JS
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浏览/下载:2/0
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提交时间:2020/01/05
design for testability (DFT)
test data volume compression
test application time reduction
scan chain disabling
Test data compression using interval broadcast scan for embedded cores
期刊论文
Microelectronics Journal, 2011, 卷号: Vol.42 No.11, 页码: 1313-1319
作者:
Zhang, Ling
;
Kuang, Ji-Shun
;
You, Zhiq-Qiang
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浏览/下载:2/0
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提交时间:2020/01/05
Test data compression
Embedded cores
Multiple scan chains
Test Data Compression Using Selective Sparse Storage
期刊论文
Journal of Electronic Testing, 2011, 卷号: Vol.27 No.4, 页码: 565-577
作者:
Zhang, L
;
Kuang, JS
;
You, ZQ
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浏览/下载:3/0
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提交时间:2020/01/05
Test data compression
Sparse storage
Soc testing
Regular test set
Code-based schemes
A New Test Data Compression Scheme
期刊论文
Journal of Computers, 2011, 卷号: Vol.6 No.7, 页码: 1297-1301
作者:
Zhang, Ling
;
Kuang, Jishun
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浏览/下载:2/0
  |  
提交时间:2020/01/05
hybrid prefix code
embedded core testing
test data compression
test regeneration
BIST scheme based on two-dimensional test data compression
期刊论文
2010, 2010
Zhou Bin
;
Ye Yizheng
;
Li Zhaolin
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浏览/下载:6/0
Extended selective encoding of scan slices for reducing test data and test power
期刊论文
Ieice transactions on information and systems, 2010, 卷号: E93d, 期号: 8, 页码: 2223-2232
作者:
Liu, Jun
;
Han, Yinhe
;
Li, Xiaowei
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浏览/下载:43/0
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提交时间:2019/05/10
Selective encoding
Test data compression
Test power reduction
Flexible grouping
X-filling
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