A novel test data compression approach based on bit reversion | |
Cai, S; Zhou, YB; Liu, P; Yu, F; Wang, W | |
刊名 | IEICE ELECTRONICS EXPRESS
![]() |
2017 | |
卷号 | Vol.14 No.13 |
关键词 | test data compression code bit reversion |
ISSN号 | 1349-2543 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6044051 |
专题 | 湖南大学 |
作者单位 | 1.Changsha Univ Sci & Technol, Hunan Prov Key Lab Intelligent Proc Big Data Tran, Changsha, Hunan, Peoples R China 2.Changsha Univ Sci & Technol, Coll Comp & Commun Engn, Changsha, Hunan, Peoples R China 3.Hunan Univ, Coll Informat Sci & Engn, Changsha, Hunan, Peoples R China |
推荐引用方式 GB/T 7714 | Cai, S,Zhou, YB,Liu, P,et al. A novel test data compression approach based on bit reversion[J]. IEICE ELECTRONICS EXPRESS,2017,Vol.14 No.13. |
APA | Cai, S,Zhou, YB,Liu, P,Yu, F,&Wang, W.(2017).A novel test data compression approach based on bit reversion.IEICE ELECTRONICS EXPRESS,Vol.14 No.13. |
MLA | Cai, S,et al."A novel test data compression approach based on bit reversion".IEICE ELECTRONICS EXPRESS Vol.14 No.13(2017). |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论