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科研机构
山东大学 [31]
北京大学 [2]
物理研究所 [1]
内容类型
期刊论文 [34]
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2018 [3]
2017 [7]
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A new method to determine the 2DEG density distribution for passivated AlGaN/AlN/GaN heterostructure field-effect transistors
期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2018, 卷号: 113, 页码: 160-168
作者:
Fu, Chen
;
Lin, Zhaojun
;
Cui, Peng
;
Lv, Yuanjie
;
Zhou, Yang
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/11
AIGaN/AIN/GaN HFETs
2DEG density distribution
Passivation
Polarization Coulomb field scattering
Influence of polarization Coulomb field scattering on high-temperature electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors
期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2018, 卷号: 120, 页码: 389-394
作者:
Liu, Yan
;
Lin, Zhaojun
;
Cui, Peng
;
Fu, Chen
;
Lv, Yuanjie
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/11
AlGaN/AlN/GaN HFET
High-temperature electron mobility
Polarization
Coulomb field scattering
Determination of the polarization and strain distribution in AlGaN/GaN heterostructure field-effect transistors
期刊论文
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2018, 卷号: 123, 页码: 223-227
作者:
Yang, Ming
;
Lv, Yuanjie
;
Cui, Peng
;
Liu, Yan
;
Fu, Chen
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/11
AlGaN/GaN HFETs
Polarization and strain distribution
Polarization
coulomb field scattering
Influence of Different Gate Biases and Gate Lengths on Parasitic Source Access Resistance in AlGaN/GaN Heterostructure FETs
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 卷号: 64, 期号: 3, 页码: 1038-1044
作者:
Cui, Peng
;
Liu, Huan
;
Lin, Wei
;
Lin, Zhaojun
;
Cheng, Aijie
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/11
AlGaN/GaNheterostructureFETs (HFETs)
gate bias
gate length
parasitic
source access resistance
polarization Coulomb field scattering
Parasitic source resistance at different temperatures for AlGaN/AlN/GaN heterostructure field-effect transistors
期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 9
作者:
Liu, Yan
;
Lin, Zhao-Jun
;
Lv, Yuan-Jie
;
Cui, Peng
;
Fu, Chen
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/11
AlGaN/AlN/GaN heterostructure field-effect transistors (HFETs)
parasitic source resistance
polarization Coulomb field scattering
Enhanced effect of diffused Ohmic contact metal atoms for device scaling in AlGaN/GaN heterostructure field-effect transistors
期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2017, 卷号: 103, 页码: 113-120
作者:
Liu, Huan
;
Cheng, Aijie
;
Lin, Zhaojun
;
Cui, Peng
;
Liu, Yan
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/11
AIGaN/GaN HFETs
Diffused Ohmic contact metal atoms
Polarization
Coulomb field scattering
Determination of the strain distribution for the Si3N4 passivated AlGaN/AlN/GaN heterostructure field-effect transistors
期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2017, 卷号: 111, 页码: 806-815
作者:
Fu, Chen
;
Lin, Zhaojun
;
Liu, Yan
;
Cui, Peng
;
Lv, Yuanjie
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/11
AlGaN/AlN/GaN HFETs
Strain distribution
Passivation
Polarization
coulomb field scattering
A method to determine electron mobility of the two-dimensional electron gas in AlGaN/GaN heterostructure field-effect transistors
期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2017, 卷号: 110, 页码: 289-295
作者:
Cui, Peng
;
Lin, Zhaojun
;
Fu, Chen
;
Liu, Yan
;
Lv, Yuanjie
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/11
AlGaN/GaN HFETs
Electron mobility
Transconductance
Polarization
Coulomb field scattering
Effects of Floating Gate Structures on the Two-Dimensional Electron Gas Density and Electron Mobility in AlGaN/AlN/GaN Heterostructure Field-Effect Transistors
期刊论文
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2017, 卷号: 71, 期号: 12, 页码: 963-967
作者:
Zhao, Jingtao
;
Zhao, Zhenguo
;
Chen, Zidong
;
Lin, Zhaojun
;
Xu, Fukai
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/12
AlGaN/AlN/GaN heterostructure field-effect transistors
Polarization
Coulomb field scattering
Floating gate structures
Two-dimensional
electron gas
Polarization charges
Parasitic source resistance at different temperatures for AlGaN/AlN/GaN heterostructure field-effect transistors
期刊论文
Chinese Physics B, 2017, 期号: 09, 页码: 393-399
作者:
Liu Y(刘艳)
;
Lin ZJ(林兆军)
;
Lv YJ(吕元杰)
;
Cui P(崔鹏)
;
Fu C(付晨)
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/12/12
Al Ga N/Al N/Ga N heterostructure field-effect transistors(HFETs)
parasitic source resistance
polarization Coulomb field scattering
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