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浏览/检索结果: 共7条，第1-7条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Extraction and Analysis of Gamma Irradiated Si BJT SPICE Model 期刊论文 ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2019, 卷号: 8, 页码: P51-P56 作者:  Lawal, Olarewaju Mubashiru;  Liu, Shuhuan;  Huang, Taiyi 收藏  |  浏览/下载：4/0  |  提交时间：2019/11/19 Experimental studies of collector-emitter voltage bias influence on the total ionization dose effects in NPN Si BJTs 期刊论文 SUPERLATTICES AND MICROSTRUCTURES, 2018, 卷号: 122, 页码: 194-202 作者:  Lawal, Olarewaju Mubashiru;  Liu, Shuhuan;  Li, Zhuoqi;  Yang, JiangKun;  Hussain, Aqil 收藏  |  浏览/下载：18/0  |  提交时间：2019/11/19 Total ionization dose effects  Excess base current  Ideality factor  Collector-emitter voltage bias conditions  Power dissipation  Bipolar junction transistor   Experimental study of pulse neutron irradiation damage in SiGe HBT 期刊论文 Journal of Nuclear Science and Technology, 2018 作者:  Lawal, Olarewaju Mubashiru;  Li, Zhuoqi;  Liu, Shuhuan;  Hussain, Aqil;  Yang, JiangKun 收藏  |  浏览/下载：3/0  |  提交时间：2019/11/19 annealing effects  excess base current  pulse neutron irradiation  radiation damage  radiation damage region  SiGe HBT   Total Ionizing Dose Effects of SiGe HBTs Induced by Co-60 Gamma-Ray Irradiation 期刊论文 NUCLEAR SCIENCE AND ENGINEERING, 2018, 卷号: 191, 页码: 98-103 作者:  Liu, Shu-Huan;  Hussain, Aqil;  Li, Da;  Guo, Xiaoqiang;  Li, Zhuo-Qi 收藏  |  浏览/下载：5/0  |  提交时间：2019/11/19 SiGe HBTs  Co-60 gamma radiation  radiation effects   Co-60 gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs 期刊论文 MICROELECTRONICS RELIABILITY, 2018, 卷号: 82, 页码: 159-164 作者:  Lawal, Olarewaju Mubashiru;  Liu, Shuhuan;  Li, Zhuoqi;  Hussai, Aqil 收藏  |  浏览/下载：1/0  |  提交时间：2019/11/26 Co-60 gamma  Current gain degradation  Bipolar transistor  EMI  Ideality factor  TID   Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation 期刊论文 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2017 作者:  Liu Shuhuan;  Du Xuecheng;  Du Xiaozhi;  Zhang Yao;  Mubashiru Lawal Olarewaju 收藏  |  浏览/下载：115/0  |  提交时间：2017/06/20 Continuous wave lasers  Digital storage  Failure modes  Irradiation  Laser beam effects  System-on-chip   Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation 会议论文 作者:  Liu, Shuhuan;  Du, Xuecheng;  Du, Xiaozhi;  Zhang, Yao;  Mubashiru, Lawal Olarewaju 收藏  |  浏览/下载：11/0  |  提交时间：2019/11/26 Xilinx Zynq-7010 SoC  DDR3  Failure modes  Laser irradiation  MicroZed