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浏览/检索结果: 共8条，第1-8条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 A novel TLP-based method to deliver IEC 61000-4-2 ESD stress 期刊论文 IEICE ELECTRONICS EXPRESS, 2017 Wang, Yize; Wang, Yuan; Lu, Guangyi; Cao, Jian; Zhang, Xing 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 electrostatic discharge (ESD)  transmission line pulse (TLP) test  SPICE model   Insight into multiple-triggering effect in DTSCRs for ESD protection 期刊论文 半导体学报（英文版）, 2017 Lizhong Zhang; Yuan Wang; Yize Wang; Yandong He 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 electrostatic discharge (ESD) diode-triggered silicon-controlled rectifier (DTSCR) double snapback transmission line pulse (TLP) test  electrostatic discharge (ESD)  diode-triggered silicon-controlled rectifier (DTSCR)  double snapback  transmission line pulse (TLP) test   System-level modeling methodology of ESD cable discharge to Ethernet transceiver through Magnetics 期刊论文 IEEE Transactions on Electromagnetic Compatibility, 2016, 卷号: 58, 期号: 5, 页码: 1407-1416 作者:  Gan, Yingjie*;  Xu, Xiaoying;  Maghlakelidze, Giorgi;  Yang, Suyu;  Huang, Wei 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/04 Cable discharge event (CDE)  electrostatic discharge  Ethernet transmission line pulse (TLP)  system efficient ESD design (SEED)   Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2016 Wang, Yuan; Lu, Guangyi; Guo, Haibing; Cao, Jian; Jia, Song; Zhang, Xing 收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03 electrostatic discharge (ESD)  power-rail clamp circuit  transmission line pulse (TLP)  current mirror  mis-triggering  ESD PROTECTION  SUPPLY CLAMP  DESIGN   A Novel Insight into Transient Behaviors of Diode-Triggered SCRs under VF-TLP Testing by 2D/3D Simulations 其他 2016-01-01 Zhang, Lizhong; Wang, Yuan; He, Yandong 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 electrostatic discharge (ESD)  diode-triggered silicon controlled rectifiers (DTSCRs)  very-fast transmission line pulse (VF-TLP)  transient behaviors   ESD Reliability Evaluations of the 60-V nLDMOS by the Drain-side Discrete SCRs 其他 2016-01-01 Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 LDMOS   ESD reliability evaluations of the 60-V nLDMOS by the drain-side discrete SCRs 其他 2016-01-01 Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 The Characteristics of ESD Protection Device Based on Static Induction Thyristors 会议论文 International Conference on Sensors, Measurement and Intelligent Materials (ICSMIM 2012), Guilin, PEOPLES R CHINA, DEC 26-27, 2012 作者:  Yang, JH;  Zhang, LJ;  Zhao, FH 收藏  |  浏览/下载：3/0  |  提交时间：2015/07/31 Electro-Static Discharge (ESD)  Static Induction Thyristors (SITh)  Robustness  Transmission Line Pulse (TLP) test