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Heavy ion-induced single event effects in active pixel sensor array 期刊论文
SOLID-STATE ELECTRONICS, 2019, 卷号: 152, 期号: 2, 页码: 93-99
作者:  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ]
收藏  |  浏览/下载:129/0  |  提交时间:2019/01/03
A wafer-level characterization method of ESD protection circuits for both component-level and system-level applications 其他
2016-01-01
Wang, Yuan; Lu, Guangyi; Zhang, Xing
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
A Wafer-level Characterization Method of ESD Protection Circuits for Both Component-level and System-level Applications 其他
2016-01-01
Wang, Yuan; Lu, Guangyi; Zhang, Xing
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Comparative research on "high currents" induced by single event latch-up and transient-induced latch-up 期刊论文
Chinese physics b, 2015, 卷号: 24, 期号: 4, 页码: 6
作者:  Chen Rui;  Han Jian-Wei;  Zheng Han-Sheng;  Yu Yong-Tao;  Shangguang Shi-Peng
收藏  |  浏览/下载:20/0  |  提交时间:2019/05/10
Comparative research on "high currents" induced by single event latch-up and transient-induced latch-up 期刊论文
CHINESE PHYSICS B, 2015, 卷号: 24, 期号: 4, 页码: 46103
作者:  Chen Rui;  Han Jian-Wei;  Zheng Han-Sheng;  Yu Yong-Tao;  Shangguang Shi-Peng
收藏  |  浏览/下载:32/0  |  提交时间:2015/09/28


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