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	Comparative research on "high currents" induced by single event latch-up and transient-induced latch-up
	Chen Rui1,2; Han Jian-Wei1; Zheng Han-Sheng1,2; Yu Yong-Tao1,2; Shangguang Shi-Peng1; Feng Guo-Qiang1; Ma Ying-Qi1
刊名	Chinese physics b
	2015-04-01
卷号	24期号:4页码:6
关键词	Single event latch-up Transient-induced latch-up Electro-static discharge Pulsed laser
ISSN号	1674-1056
DOI	10.1088/1674-1056/24/4/046103
通讯作者	Chen rui(chenrui632@sina.com)
英文摘要	By using the pulsed laser single event effect facility and electro-static discharge (esd) test system, the characteristics of the "high current", relation with external stimulus and relevance to impacted modes of single event latch-up (sel) and transient-induced latch-up (tlu) are studied, respectively, for a 12-bit complementary metal-oxide semiconductor (cmos) analog-to-digital converter. furthermore, the sameness and difference in physical mechanism between "high current" induced by sel and that by tlu are disclosed in this paper. the results show that the minority carrier diffusion in the pnpn structure of the cmos device which initiates the active parasitic npn and pnp transistors is the common reason for the "high current" induced by sel and for that by tlu. however, for sel, the minority carrier diffusion is induced by the ionizing radiation, and an underdamped sinusoidal voltage on the supply node (the ground node) is the cause of the minority carrier diffusion for tlu.
WOS关键词	SIMULATION
WOS研究方向	Physics
WOS类目	Physics, Multidisciplinary
语种	英语
出版者	IOP PUBLISHING LTD
WOS记录号	WOS:000354727300046
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2376548
专题	中国科学院大学
通讯作者	Chen Rui
作者单位	1.Chinese Acad Sci, Natl Space Sci Ctr, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Chen Rui,Han Jian-Wei,Zheng Han-Sheng,et al. Comparative research on "high currents" induced by single event latch-up and transient-induced latch-up[J]. Chinese physics b,2015,24(4):6.
APA	Chen Rui.,Han Jian-Wei.,Zheng Han-Sheng.,Yu Yong-Tao.,Shangguang Shi-Peng.,...&Ma Ying-Qi.(2015).Comparative research on "high currents" induced by single event latch-up and transient-induced latch-up.Chinese physics b,24(4),6.
MLA	Chen Rui,et al."Comparative research on "high currents" induced by single event latch-up and transient-induced latch-up".Chinese physics b 24.4(2015):6.

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