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Radiation Effects and Mechanisms on Switching Characteristics of Silicon Carbide Power MOSFETs
期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2021, 卷号: 16, 期号: 9, 页码: 1423-1429
作者:
Feng, HN (Feng, Haonan) [1] , [2] , [3]
;
Yang, S (Yang, Sheng) [1] , [2] , [3]
;
Liang, XW (Liang, Xiaowen) [1] , [2] , [3]
;
Zhang, D (Zhang, Dan) [1] , [2] , [3]
;
Pu, XJ (Pu, Xiaojuan) [1] , [2] , [3]
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2022/03/24
SiC Power MOSFETs
Switching Characteristics
Total Ionizing Dose (TID) Effect
Static Characteristic
Parasitic Capacitance
A Charge Density Model of Silicon-nanowire GAA MOSFET Incoroperating the Source-drian Tunneling Effect for IC Design
会议论文
Guilin, China, June 4-6, 2021
作者:
Cheng H(程贺)
;
Zhang C(张超)
;
Liu TF(刘铁锋)
;
Xie C(谢闯)
;
Yang ZJ(杨志家)
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2022/02/04
ballistic transport
compact model
integrated-cricuit design
sub-7 nm GAA MOSFET
the source-drain tunneling
An investigation of FinFET single-event latch-up characteristic and mitigation method
期刊论文
MICROELECTRONICS RELIABILITY, 2020, 卷号: 114, 页码: 8
作者:
Li, Dongqing
;
Liu, Tianqi
;
Wu, Zhenyu
;
Cai, Chang
;
Zhao, Peixiong
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2021/12/13
TCAD
FinFET
SCR
SEL
Nanowire gate-all-around MOSFETs modeling: ballistic transport incorporating the source-to-drain tunneling
期刊论文
Japanese Journal of Applied Physics, 2020, 卷号: 59, 期号: 7, 页码: 1-9
作者:
Cheng H(程贺)
;
Liu TF(刘铁锋)
;
Zhang C(张超)
;
Liu ZF(刘志峰)
;
Yang ZJ(杨志家)
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2020/07/11
ballistic transport
cylindrical gate-allaround (GAA) MOSFET
compact model
Wentzel-Kramers-Brillouin (WKB) approximation
the source-to-drain tunneling
Online junction temperature estimation method for SiC modules with built-in NTC sensor
期刊论文
CPSS Transactions on Power Electronics and Applications, 2019, 卷号: Vol.4 No.1, 页码: 94-99
作者:
Ping Liu
;
Changle Chen
;
Xing Zhang
;
Shoudao Huang
收藏
  |  
浏览/下载:101/0
  |  
提交时间:2019/12/13
Silicon carbide
Junctions
MOSFET
Temperature sensors
Impedance
Heating systems
Mathematical model
Boundary conditions
junction temperature
silicon carbide (SiC)
thermal model.
Carrier-Based Double Integral Sliding-Mode Controller of Class-D Amplifier
期刊论文
IEEE Access, 2019, 卷号: Vol.7, 页码: 1275-1283
作者:
Xiaohua Wu
;
Haider Zaman
;
Xiancheng Zheng
;
Shahbaz Khan
;
Husan Ali
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/12/13
Mathematical
model
Frequency
response
Q-factor
Control
systems
Switching
frequency
Silicon
carbide
Voltage
control
Carrier-based
double
integral
sliding-mode
(CBDISM)
class-D
amplifier
Q-factor
SiC
MOSFET
Short-Circuit Ruggedness and Failure Mechanisms of Si/SiC Hybrid Switch
期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: Vol.34 No.3, 页码: 2771-2780
作者:
Jun Wang
;
Xi Jiang
;
Zongjian Li
;
Z. John Shen
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/12/13
MOSFET
Silicon carbide
Logic gates
Insulated gate bipolar transistors
Switches
Leakage currents
Silicon
Failure analysis
gate control
hybrid switch (HyS)
IGBT
short-circuit (SC)
Silicon Carbide (SiC) $\scriptscriptstyle{\text{MOSFET}}$
Gate Control Optimization of Si/SiC Hybrid Switch for Junction Temperature Balance and Power Loss Reduction
期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: Vol.34 No.2, 页码: 1744-1754
作者:
Jun Wang
;
Zongjian Li
;
Xi Jiang
;
Cheng Zeng
;
Z. John Shen
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/13
Switches
Insulated
gate
bipolar
transistors
Silicon
carbide
MOSFET
Logic
gates
Silicon
Gate
control
hybrid
switch
IGBT
junction
temperature
mosfet
power
loss
SiC
Threshold Voltage Characteristics for Silicon Nanowire Field-Effect Transistor With a Double-Layer Gate Structure
期刊论文
IEEE Transactions on Electron Devices, 2019, 卷号: Vol.66 No.1, 页码: 771-776
作者:
Hongguan Yang
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/12/13
Logic
gates
Threshold
voltage
Silicon
MOSFET
Transconductance
Nanoscale
devices
Double-layer
gate
structure
MOS
devices
short-channel
effect
silicon
nanowire
(Si-NW)
threshold
voltage
characteristics
Short-Circuit Ruggedness and Failure Mechanisms of Si/SiC Hybrid Switch
期刊论文
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, 卷号: Vol.34 No.3, 页码: 2771-2780
作者:
Wang, J
;
Jiang, X
;
Li, ZJ
;
Shen, ZJ
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/12/17
Failure analysis
gate control
hybrid switch (HyS)
IGBT
short-circuit (SC)
Silicon Carbide (SiC) MOSFET
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