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浏览/检索结果: 共3条，第1-3条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Reliability evaluation of high-performance, low-power FinFET standard cells based on mixed RBB/FBB technique 期刊论文 Journal of Semiconductors, 2017 Wang Tian; Cui Xiaoxin; Ni Yewen; Liao Kai; Liao Nan; Yu Dunshan; Cui Xiaole 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 reliability  FinFET  standard cell  low power  VLSI   Reliability evaluation of high-performance,low-power FinFET standard cells based on mixed RBB/FBB technique 期刊论文 Journal of Semiconductors, 2017 Tian Wang; Xiaoxin Cui; Yewen Ni; Kai Liao; Nan Liao; Dunshan Yu; Xiaole Cui 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 reliability  FinFET  standard cell  low power  VLSI   Reliability evaluation of high-performance, low-power FinFET standard cells based on mixed RBB/FBB technique 期刊论文 半导体学报（英文版）, 2017 Tian Wang; Xiaoxin Cui; Yewen Ni; Kai Liao; Nan Liao; Dunshan Yu; Xiaole Cui 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 reliability FinFET standard cell low power VLSI  reliability  FinFET  standard cell  low power  VLSI