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Stable Red Light-Emitting Devices Based onCd:CsMnBr3With High Photoluminescence Quantum Yield via Cd Incorporation 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 页码: 6
作者:  Ma, Yibo;  Zhang, Xiaodong;  Qiu, Haiyu;  Guo, Jing;  Tian, Chuan
收藏  |  浏览/下载：6/0  |  提交时间：2023/12/12
Efficient planar heterojunction perovskite solar cells with enhanced FTO/SnO2 interface electronic coupling 期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2020, 卷号: 831
作者:  Zhang, Danli;  Tian, Hanmin;  Bu, Shixiao;  Yan, Tingting;  Ge, Jinfeng
收藏  |  浏览/下载：45/0  |  提交时间：2020/12/16
All-Optically Controlled Memristor for Optoelectronic Neuromorphic Computing 期刊论文
ADVANCED FUNCTIONAL MATERIALS, 2020
作者:  Hu, Lingxiang;  Yang, Jing;  Wang, Jingrui;  Cheng, Peihong;  Chua, Leon O.
收藏  |  浏览/下载：118/0  |  提交时间：2020/12/16
Charge trapping effect in HfO2-based high-k gate dielectric stacks after heavy ion irradiation: The role of oxygen vacancy 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 459, 页码: 143-147
作者:  Li, Zongzhen;  Liu, Tianqi;  Bi, Jinshun;  Yao, Huijun;  Zhang, Zhenxing
收藏  |  浏览/下载：34/0  |  提交时间：2022/01/19
Comparison of holes trapping and protons transport induced by low dose rate gamma radiation in oxide on different SiGe processes 期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 103, 期号: 12, 页码: 1-5
作者:  Li, P (Li, Pei)[ 1 ];  He, CH (He, ChaoHui)[ 1 ];  Guo, HX (Guo, HongXia)[ 2,3 ];  Zhang, JX (Zhang, JinXin)[ 4 ];  Li, YH (Li, YongHong)[ 1 ]
收藏  |  浏览/下载：34/0  |  提交时间：2020/01/10
A Fast Vth Measurement Technique for NBTI Behavior Characterization. 期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:  Yu, Xiao;  Cheng, Ran;  Liu, Wei;  Qu, Yiming;  Han, Jinghui
收藏  |  浏览/下载：6/0  |  提交时间：2019/12/26
A Fast Vth Measurement (FVM) Technique for NBTI Behavior Characterization 期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:  Xiao Yu;  Ran Cheng;  Wei Liu;  Yiming Qu;  Jinghui Han
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/26
A Fast $V_{th}$ Measurement (FVM) Technique for NBTI Behavior Characterization 期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:  Yu, X;  Cheng, R;  Liu, W;  Qu, YM;  Han, JH
收藏  |  浏览/下载：9/0  |  提交时间：2019/12/26
Reversible manipulation of lattice defects in single-crystal SnO2 microrod by applying mechanical stress and voltage 期刊论文
Journal of Applied Physics, 2018, 卷号: 125, 期号: 8
作者:  Sakurai, Makoto;  Liu, Kewei;  Aono, Masakazu
收藏  |  浏览/下载：1/0  |  提交时间：2019/09/17
Surface Defects Enhanced Visible Light Photocatalytic H-2 Production for Zn-Cd-S Solid Solution 期刊论文
Small, 2016, 卷号: 12, 期号: 6
作者:  Zhang, X. Y.;  Z. Zhao;  W. W. Zhang;  G. Q. Zhang;  D. Qu
收藏  |  浏览/下载：12/0  |  提交时间：2017/09/11

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